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Fabrication of Nanocrystalline Silicon Gratings Embedded within a Silicon Nitride Matrix by Femtosecond Laser-Induced Crystallization

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dc.contributor.authorLee, Geon Joon-
dc.contributor.authorLee, Kyoung-Min-
dc.contributor.authorHong, Wan-Shick-
dc.contributor.authorKim, Sung Soo-
dc.contributor.authorCheong, Hyeonsik-
dc.contributor.authorYoon, Chong Seung-
dc.contributor.authorLee, YoungPak-
dc.date.accessioned2022-12-20T19:16:20Z-
dc.date.available2022-12-20T19:16:20Z-
dc.date.created2022-08-27-
dc.date.issued2010-01-
dc.identifier.issn0021-4922-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/175560-
dc.description.abstractNanocrystalline silicon gratings were fabricated by applying both femtosecond-laser-interference crystallization and post thermal annealing to amorphous silicon (a-Si) nanoclusters embedded within a silicon nitride matrix. Catalytic chemical vapor deposition was used to fabricate the embedded a-Si nanoclusters, and the formation of a-Si nanoclusters was confirmed by photoluminescence spectroscopy. The femtosecond laser interference technique was employed to produce a seed pattern for the spatially-selected crystallization of a-Si nanoclusters. Micro-Raman spectroscopy and selected-area electron diffraction, together with high-resolution transmission-electron microscopy, show that nanocrystalline silicon gratings were formed through an amorphous-to-crystalline transformation with femtosecond laser pulses, and that the degree of crystallization was enhanced by applying post thermal annealing to the seed gratings.-
dc.language영어-
dc.language.isoen-
dc.publisherJAPAN SOC APPLIED PHYSICS-
dc.titleFabrication of Nanocrystalline Silicon Gratings Embedded within a Silicon Nitride Matrix by Femtosecond Laser-Induced Crystallization-
dc.typeArticle-
dc.contributor.affiliatedAuthorYoon, Chong Seung-
dc.identifier.doi10.1143/JJAP.49.015502-
dc.identifier.scopusid2-s2.0-77950823148-
dc.identifier.wosid000275607900043-
dc.identifier.bibliographicCitationJAPANESE JOURNAL OF APPLIED PHYSICS, v.49, no.1, pp.1 - 4-
dc.relation.isPartOfJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.citation.titleJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.citation.volume49-
dc.citation.number1-
dc.citation.startPage1-
dc.citation.endPage4-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusCHEMICAL-VAPOR-DEPOSITION-
dc.subject.keywordPlusMICROCRYSTALLINE SILICON-
dc.subject.keywordPlusAMORPHOUS-SILICON-
dc.subject.keywordPlusOPTICAL GAIN-
dc.subject.keywordPlusQUANTUM DOTS-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusPHOTOLUMINESCENCE-
dc.subject.keywordPlusNANOSTRUCTURES-
dc.subject.keywordPlusEMISSION-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1143/JJAP.49.015502-
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