Effect of interface chemical properties on nonvolatile memory characteristics for small-molecule memory cells embedded with Ni nano-crystals surrounded by NiO
DC Field | Value | Language |
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dc.contributor.author | Seo, Sung-Ho | - |
dc.contributor.author | Nam, Woo-Sik | - |
dc.contributor.author | Kim, Jae-Suk | - |
dc.contributor.author | Lee, Sang-Yi | - |
dc.contributor.author | Shim, Tae-Hun | - |
dc.contributor.author | Park, Jea-Gun | - |
dc.date.accessioned | 2022-12-20T19:18:28Z | - |
dc.date.available | 2022-12-20T19:18:28Z | - |
dc.date.created | 2022-08-27 | - |
dc.date.issued | 2010-01 | - |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/175575 | - |
dc.description.abstract | We investigated the effect of the chemical properties of the interface on nonvolatile memory characteristics for small-molecule memory cells embedded with Ni nano-crystals surrounded by a NiO tunneling barrier. We used ultra-high voltage TEM, Auger, and XPS to characterize the physical and chemical properties of the interface. It was found that the occurrence of chemical reactions between the small-molecule layers and the surface of the NiO tunneling barrier surrounding the Ni nano-crystals (e.g., NiCO3) conclusively determine nonvolatile memory characteristics such as memory margin (I-on/I-off ratio), retention time, and endurance cycles of writing and erasing. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER | - |
dc.title | Effect of interface chemical properties on nonvolatile memory characteristics for small-molecule memory cells embedded with Ni nano-crystals surrounded by NiO | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Park, Jea-Gun | - |
dc.identifier.doi | 10.1016/j.cap.2009.12.008 | - |
dc.identifier.scopusid | 2-s2.0-77649238807 | - |
dc.identifier.wosid | 000278635400009 | - |
dc.identifier.bibliographicCitation | CURRENT APPLIED PHYSICS, v.10, no.1, pp.E32 - E36 | - |
dc.relation.isPartOf | CURRENT APPLIED PHYSICS | - |
dc.citation.title | CURRENT APPLIED PHYSICS | - |
dc.citation.volume | 10 | - |
dc.citation.number | 1 | - |
dc.citation.startPage | E32 | - |
dc.citation.endPage | E36 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.description.journalRegisteredClass | kci | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | THIN-FILM | - |
dc.subject.keywordPlus | SOLAR-CELLS | - |
dc.subject.keywordPlus | DEVICES | - |
dc.subject.keywordPlus | BISTABILITY | - |
dc.subject.keywordPlus | EFFICIENCY | - |
dc.subject.keywordAuthor | Small-molecule | - |
dc.subject.keywordAuthor | Nonvolatile memory | - |
dc.subject.keywordAuthor | Nano-crystal | - |
dc.subject.keywordAuthor | Interface property | - |
dc.identifier.url | https://www.sciencedirect.com/science/article/pii/S1567173909005951?via%3Dihub | - |
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