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Theoretical prediction of the antiferromagnetic ground state of a C defect on Si(001)

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dc.contributor.authorChoi, Jin-Ho-
dc.contributor.authorCho, Jun-Hyung-
dc.date.accessioned2022-12-20T21:00:03Z-
dc.date.available2022-12-20T21:00:03Z-
dc.date.issued2009-09-
dc.identifier.issn1098-0121-
dc.identifier.issn1550-235X-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/176259-
dc.description.abstractWe have performed first-principles density-functional calculations for the C defect on Si(001), which has been experimentally identified in terms of the dissociative adsorption of a single water molecule on two adjacent dimers. Unlike the hitherto accepted nonmagnetic structure that involves the buckling of two Si dangling bonds (DBs) within the C defect, the presently proposed structure shows that the two DBs are antiferromagnetically coupled with each other, thereby giving rise to a suppression of their buckling. This antiferromagnetic ground state of C defect reproduces the key features observed in the STM and STS experiments.-
dc.format.extent4-
dc.language영어-
dc.language.isoENG-
dc.publisherAmerican Physical Society-
dc.titleTheoretical prediction of the antiferromagnetic ground state of a C defect on Si(001)-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1103/PhysRevB.80.125314-
dc.identifier.wosid000270383300081-
dc.identifier.bibliographicCitationPhysical Review B - Condensed Matter and Materials Physics, v.80, no.12, pp 1 - 4-
dc.citation.titlePhysical Review B - Condensed Matter and Materials Physics-
dc.citation.volume80-
dc.citation.number12-
dc.citation.startPage1-
dc.citation.endPage4-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusELECTRONIC-STRUCTURE-
dc.subject.keywordPlusSELF-CONSISTENT-
dc.subject.keywordPlusSI(100) SURFACE-
dc.subject.keywordPlusSILICON-
dc.subject.keywordPlusPSEUDOPOTENTIALS-
dc.subject.keywordPlusDYNAMICS-
dc.subject.keywordPlusMODEL-
dc.identifier.urlhttps://journals.aps.org/prb/abstract/10.1103/PhysRevB.80.125314-
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