Low-Temperature Atomic Layer Deposition of Copper Metal Thin Films: Self-Limiting Surface Reaction of Copper Dimethylamino-2-propoxide with Diethylzinc
DC Field | Value | Language |
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dc.contributor.author | Lee, Byoung H. | - |
dc.contributor.author | Hwang, Jae K. | - |
dc.contributor.author | Nam, Jae W. | - |
dc.contributor.author | Lee, Song U. | - |
dc.contributor.author | Kim, Jun T. | - |
dc.contributor.author | Koo, Sang-M. | - |
dc.contributor.author | Baunemann, A. | - |
dc.contributor.author | Fischer, Roland A. | - |
dc.contributor.author | Sung, Myung M. | - |
dc.date.accessioned | 2022-12-20T21:53:28Z | - |
dc.date.available | 2022-12-20T21:53:28Z | - |
dc.date.created | 2022-08-26 | - |
dc.date.issued | 2009-06 | - |
dc.identifier.issn | 1433-7851 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/176665 | - |
dc.description.abstract | A uniform, conformal, pure copper metal thin film was grown at very low substrate temperatures (100-120 °C) on Si(100) substrates by atomic layer deposition involving the ligand exchange of [Cu(OCHMeCH2NMe 2)2] with Et2Zn (see scheme). Patterned copper thin films of Cu nanotubes (diameter 150 nm, length 12 μm) were fabricated. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | WILEY-V C H VERLAG GMBH | - |
dc.title | Low-Temperature Atomic Layer Deposition of Copper Metal Thin Films: Self-Limiting Surface Reaction of Copper Dimethylamino-2-propoxide with Diethylzinc | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Koo, Sang-M. | - |
dc.contributor.affiliatedAuthor | Sung, Myung M. | - |
dc.identifier.doi | 10.1002/anie.200900414 | - |
dc.identifier.scopusid | 2-s2.0-70349959811 | - |
dc.identifier.wosid | 000267305300017 | - |
dc.identifier.bibliographicCitation | ANGEWANDTE CHEMIE-INTERNATIONAL EDITION, v.48, no.25, pp.4536 - 4539 | - |
dc.relation.isPartOf | ANGEWANDTE CHEMIE-INTERNATIONAL EDITION | - |
dc.citation.title | ANGEWANDTE CHEMIE-INTERNATIONAL EDITION | - |
dc.citation.volume | 48 | - |
dc.citation.number | 25 | - |
dc.citation.startPage | 4536 | - |
dc.citation.endPage | 4539 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.subject.keywordPlus | CHEMICAL-VAPOR-DEPOSITION | - |
dc.subject.keywordPlus | ASSEMBLED MONOLAYERS | - |
dc.subject.keywordPlus | TITANIUM-OXIDE | - |
dc.subject.keywordPlus | TIO2 | - |
dc.subject.keywordPlus | XPS | - |
dc.subject.keywordPlus | CU | - |
dc.subject.keywordAuthor | atomic layer deposition | - |
dc.subject.keywordAuthor | copper | - |
dc.subject.keywordAuthor | surface chemistry | - |
dc.subject.keywordAuthor | thin films | - |
dc.subject.keywordAuthor | zinc | - |
dc.identifier.url | https://onlinelibrary.wiley.com/doi/10.1002/anie.200900414 | - |
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