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Microwave absorption measurements using a broad-band meanderline approach

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dc.contributor.authorTsai, Chih Cheih-
dc.contributor.authorChoi, Jin Taek-
dc.contributor.authorCho, Sunglae-
dc.contributor.authorLee, Seong Jae-
dc.contributor.authorSarma, Bimal K.-
dc.contributor.authorThompson, Cynthia K.-
dc.contributor.authorChernyashevskyy, Oleksandr-
dc.contributor.authorChernyashevskyy, Oleksandr-
dc.contributor.authorKetterson, John B-
dc.date.accessioned2022-12-20T23:20:57Z-
dc.date.available2022-12-20T23:20:57Z-
dc.date.issued2009-02-
dc.identifier.issn0034-6748-
dc.identifier.issn1089-7623-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/177270-
dc.description.abstractWe describe a technique that permits broad-band, field-dependent ferromagnetic and electron paramagnetic resonance absorption measurements that is applicable to thin films and patterned micro-/nanostructured arrays and is based on a wire-wound meanderline approach. Techniques to prepare meanderlines and perform microwave measurements are described along with some demonstrations involving an electron paramagnetic resonance calibration/test material, 2,2-diphenyl-1-picryl-hydrazyl, and a ferromagnetic cobalt thin film.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherAmerican Institute of Physics-
dc.titleMicrowave absorption measurements using a broad-band meanderline approach-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1063/1.3070471-
dc.identifier.scopusid2-s2.0-61449252585-
dc.identifier.wosid000263803500026-
dc.identifier.bibliographicCitationReview of Scientific Instruments, v.80, no.2, pp 1 - 8-
dc.citation.titleReview of Scientific Instruments-
dc.citation.volume80-
dc.citation.number2-
dc.citation.startPage1-
dc.citation.endPage8-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusPENETRATION DEPTH MEASUREMENTS-
dc.subject.keywordPlusNANODOTS-
dc.subject.keywordPlusARRAYS-
dc.subject.keywordPlusFILMS-
dc.subject.keywordPlusLINE-
dc.subject.keywordAuthorcobalt-
dc.subject.keywordAuthorferromagnetic materials-
dc.subject.keywordAuthorferromagnetic resonance-
dc.subject.keywordAuthormagnetic thin films-
dc.subject.keywordAuthormetallic thin films-
dc.subject.keywordAuthornanostructured materials-
dc.subject.keywordAuthororganic compounds-
dc.subject.keywordAuthorparamagnetic resonance-
dc.identifier.urlhttps://aip.scitation.org/doi/10.1063/1.3070471-
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