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A new solder wetting layer for Pb-free solders

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dc.contributor.authorOh, Chang Yul-
dc.contributor.authorRoh, Hee-Ra-
dc.contributor.authorKim, Young Min-
dc.contributor.authorLee, Jin Soo-
dc.contributor.authorCho, Hae Young-
dc.contributor.authorKim, Young-Ho-
dc.date.accessioned2022-12-20T23:34:17Z-
dc.date.available2022-12-20T23:34:17Z-
dc.date.created2022-08-26-
dc.date.issued2009-02-
dc.identifier.issn0884-2914-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/177296-
dc.description.abstractWe developed a new Cu-Zn wetting layer for Pb-free solders. By adding Zn to the Cu wetting layer, intermetallic growth in the Sn-Ag-Cu (SAC) solder interfaces was delayed. Cu3Sn intermetallic compounds and microvoids were not observed ill the SAC/Cu-Zn interfaces after aging. The drop reliability of the SAC solder/Cu-Zn joints was excellent.-
dc.language영어-
dc.language.isoen-
dc.publisherSPRINGER HEIDELBERG-
dc.titleA new solder wetting layer for Pb-free solders-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Young-Ho-
dc.identifier.doi10.1557/JMR.2009.0047-
dc.identifier.scopusid2-s2.0-61749087132-
dc.identifier.wosid000267207600001-
dc.identifier.bibliographicCitationJOURNAL OF MATERIALS RESEARCH, v.24, no.2, pp.297 - 300-
dc.relation.isPartOfJOURNAL OF MATERIALS RESEARCH-
dc.citation.titleJOURNAL OF MATERIALS RESEARCH-
dc.citation.volume24-
dc.citation.number2-
dc.citation.startPage297-
dc.citation.endPage300-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.subject.keywordPlusSN-AG-CU-
dc.subject.keywordPlusINTERFACIAL REACTIONS-
dc.subject.keywordPlusSN-3.5AG SOLDER-
dc.subject.keywordPlusZN-
dc.subject.keywordPlusMICROSTRUCTURE-
dc.subject.keywordPlusRELIABILITY-
dc.subject.keywordPlusALLOYS-
dc.subject.keywordPlusGROWTH-
dc.identifier.urlhttps://link.springer.com/article/10.1557/JMR.2009.0047-
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