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Microphotoluminescence spectroscopy of single CdTe/ZnTe quantum dots grown on Si(001) substrates
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Hong Seok | - |
| dc.contributor.author | Rastelli, Armando | - |
| dc.contributor.author | Benyoucef, Mohamed | - |
| dc.contributor.author | Ding, Fei | - |
| dc.contributor.author | Kim, Tae Whan | - |
| dc.contributor.author | Park, Hong Lee | - |
| dc.contributor.author | Schmidt, Oliver G. | - |
| dc.date.accessioned | 2022-12-20T23:39:52Z | - |
| dc.date.available | 2022-12-20T23:39:52Z | - |
| dc.date.issued | 2009-02 | - |
| dc.identifier.issn | 0957-4484 | - |
| dc.identifier.issn | 1361-6528 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/177332 | - |
| dc.description.abstract | We have studied the emission properties of single CdTe/ZnTe quantum dots (QDs) grown on Si(001) substrates by using molecular beam epitaxy and atomic layer epitaxy. The good quality of the QDs is attested by the resolution-limited emission, negligible background and absence of measurable spectral jitter or blinking. Power-dependent, polarization-dependent, and temperature-dependent microphotoluminescence spectroscopy measurements were performed to identify the exciton, the biexciton, and two oppositely charged excitons in the emission spectra of single QDs. | - |
| dc.format.extent | 5 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Physics Publishing | - |
| dc.title | Microphotoluminescence spectroscopy of single CdTe/ZnTe quantum dots grown on Si(001) substrates | - |
| dc.type | Article | - |
| dc.publisher.location | 영국 | - |
| dc.identifier.doi | 10.1088/0957-4484/20/7/075705 | - |
| dc.identifier.scopusid | 2-s2.0-65349099014 | - |
| dc.identifier.wosid | 000262786100029 | - |
| dc.identifier.bibliographicCitation | Nanotechnology, v.20, no.7, pp 1 - 5 | - |
| dc.citation.title | Nanotechnology | - |
| dc.citation.volume | 20 | - |
| dc.citation.number | 7 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 5 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalResearchArea | Physics | - |
| dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
| dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
| dc.subject.keywordPlus | EXCITON FINE-STRUCTURE | - |
| dc.subject.keywordPlus | COMPLEXES | - |
| dc.subject.keywordPlus | ELECTRON | - |
| dc.identifier.url | https://iopscience.iop.org/article/10.1088/0957-4484/20/7/075705 | - |
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