In-Situ Torque Magnetometry: Magnetic Coupling in Fe/Cr/Fe Thin-Film Systems
- Authors
- Min, Dong-Hun; Lee, Seung Beck; Moreland, John
- Issue Date
- Oct-2008
- Publisher
- KOREAN PHYSICAL SOC
- Keywords
- MEMES torque magnetometer; Cantilever; Interlayer exchange coupling
- Citation
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.53, no.4, pp.2057 - 2061
- Indexed
- SCIE
SCOPUS
KCI
- Journal Title
- JOURNAL OF THE KOREAN PHYSICAL SOCIETY
- Volume
- 53
- Number
- 4
- Start Page
- 2057
- End Page
- 2061
- URI
- https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/177837
- DOI
- 10.3938/jkps.53.2057
- ISSN
- 0374-4884
- Abstract
- We have developed an ultra-sensitive torque magnetometer tailored to the study of thin-film interface magnetism and interlayer magnetic exchange coupling. The magnetometer was composed of an optical-fiber interferometer and a customized silicon cantilever that was fabricated using silicon micro-electromechanical system (MEMS) technology. The performance of the magnetometer was gauged by measuring the couplings of the Fe/Cr/Fe trilayer system deposited on a Si < 110 > substrate. The antiferomagnetic stacking of the Cr layers of the Fe/Cr/Fe system and the parallel or the antiparallel coupling between the bottom Fe and the top Fe layers with various Cr spacer thicknesses were monitored by using a MEMS torque magnetometer. We found short- (similar to 2.05 ML Cr spacer thickness) and long-period (similar to 13.80 ML Cr spacer thickness) oscillations of the interlayer exchange coupling of the Fe/Cr/Fe trilayer system.
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