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Physical configuration of Ar molecules on metal-oxide surfaces

Authors
Lee, JeonggilKim, EuikwounLee, SangwhaKim, Jae-YongLee, Ik Jae
Issue Date
May-2008
Publisher
KOREAN PHYSICAL SOC
Keywords
surface structure; synchrotron X-ray diffraction; metal oxides
Citation
JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.52, no.5, pp.1681 - 1684
Indexed
SCIE
SCOPUS
KCI
Journal Title
JOURNAL OF THE KOREAN PHYSICAL SOCIETY
Volume
52
Number
5
Start Page
1681
End Page
1684
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178660
DOI
10.3938/jkps.52.1681
ISSN
0374-4884
Abstract
A combined thermodynamic and structural investigation of the interaction of argon with a MgO (100) surface was made. Ar gas adsorption isotherm studies recorded below the triple point showed the formation of at least two atomic layers of argon in the temperature above 77 K. Synchrotron X-ray diffraction (XRD) data were also recorded from a monolayer film of argon on MgO (100) surface for a series of different temperatures at the 5A-HFMS beamline of the Pohang Synchrotron Light Source in Korea. X-ray diffraction peaks from the Ar atomic layer were measured by taking the difference spectra between monolayer coverage and no argon coverage. Analyzing the data suggested that the Ar molecules form an 1 x 1 structure on the MgO (100) surface.
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