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Design of temperature-compensated complementary metal-oxide semiconductor voltage reference sources with a small temperature coefficient

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dc.contributor.authorPark, Kyung Soo-
dc.contributor.authorWoo, Sun Bo-
dc.contributor.authorDal Kwack, Kae-
dc.contributor.authorKim, Tae Whan-
dc.date.accessioned2022-12-21T03:20:57Z-
dc.date.available2022-12-21T03:20:57Z-
dc.date.issued2008-05-
dc.identifier.issn0916-8524-
dc.identifier.issn1745-1353-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178681-
dc.description.abstractA novel design for temperature-compensated complementary metal-oxide semiconductor (CMOS) voltage reference sources by using the 1st order voltage reference taking into account the electrical property of the conventional current generator was proposed to minimize a temperature coefficient. A temperature coefficient of the proposed voltage reference source was estimated by using the current generator, which operated at smaller or larger temperature in comparison with the optimized operating temperature. The temperature coefficient at temperature range between -40 degrees C and 125 degrees C, obtained from the simulated data by using hynix 0.35 pm CMOS technology, was 3.33 ppm/degrees C. The simulated results indicate that the proposed temperature-compensated CMOS voltage reference sources by using the 1st order voltage reference taking into account the electrical properties of the conventional current generator can be used to decrease the temperature coefficient.-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherOxford University Press-
dc.titleDesign of temperature-compensated complementary metal-oxide semiconductor voltage reference sources with a small temperature coefficient-
dc.typeArticle-
dc.publisher.location일본-
dc.identifier.doi10.1093/ietele/e91-c.5.751-
dc.identifier.scopusid2-s2.0-77953554780-
dc.identifier.wosid000256861500016-
dc.identifier.bibliographicCitationIEICE Transactions on Electronics, v.E91C, no.5, pp 751 - 755-
dc.citation.titleIEICE Transactions on Electronics-
dc.citation.volumeE91C-
dc.citation.number5-
dc.citation.startPage751-
dc.citation.endPage755-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusBANDGAP REFERENCE-
dc.subject.keywordPlusCMOS integrated circuits-
dc.subject.keywordPlusDielectric devices-
dc.subject.keywordPlusIntegrated circuit design-
dc.subject.keywordPlusMetallic compounds-
dc.subject.keywordPlusMetals-
dc.subject.keywordPlusMOS devices-
dc.subject.keywordPlusOxide semiconductors-
dc.subject.keywordPlusTransistors-
dc.subject.keywordPlusVoltage measurement-
dc.subject.keywordAuthor1st order voltage reference-
dc.subject.keywordAuthortemperature compensation-
dc.subject.keywordAuthortemperature coefficient-
dc.subject.keywordAuthornonlinearity of base-emitter voltage-
dc.identifier.urlhttps://www.jstage.jst.go.jp/article/transele/E91.C/5/E91.C_5_751/_article-
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