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Design of temperature-compensated complementary metal-oxide semiconductor voltage reference sources with a small temperature coefficient
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Park, Kyung Soo | - |
| dc.contributor.author | Woo, Sun Bo | - |
| dc.contributor.author | Dal Kwack, Kae | - |
| dc.contributor.author | Kim, Tae Whan | - |
| dc.date.accessioned | 2022-12-21T03:20:57Z | - |
| dc.date.available | 2022-12-21T03:20:57Z | - |
| dc.date.issued | 2008-05 | - |
| dc.identifier.issn | 0916-8524 | - |
| dc.identifier.issn | 1745-1353 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/178681 | - |
| dc.description.abstract | A novel design for temperature-compensated complementary metal-oxide semiconductor (CMOS) voltage reference sources by using the 1st order voltage reference taking into account the electrical property of the conventional current generator was proposed to minimize a temperature coefficient. A temperature coefficient of the proposed voltage reference source was estimated by using the current generator, which operated at smaller or larger temperature in comparison with the optimized operating temperature. The temperature coefficient at temperature range between -40 degrees C and 125 degrees C, obtained from the simulated data by using hynix 0.35 pm CMOS technology, was 3.33 ppm/degrees C. The simulated results indicate that the proposed temperature-compensated CMOS voltage reference sources by using the 1st order voltage reference taking into account the electrical properties of the conventional current generator can be used to decrease the temperature coefficient. | - |
| dc.format.extent | 5 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Oxford University Press | - |
| dc.title | Design of temperature-compensated complementary metal-oxide semiconductor voltage reference sources with a small temperature coefficient | - |
| dc.type | Article | - |
| dc.publisher.location | 일본 | - |
| dc.identifier.doi | 10.1093/ietele/e91-c.5.751 | - |
| dc.identifier.scopusid | 2-s2.0-77953554780 | - |
| dc.identifier.wosid | 000256861500016 | - |
| dc.identifier.bibliographicCitation | IEICE Transactions on Electronics, v.E91C, no.5, pp 751 - 755 | - |
| dc.citation.title | IEICE Transactions on Electronics | - |
| dc.citation.volume | E91C | - |
| dc.citation.number | 5 | - |
| dc.citation.startPage | 751 | - |
| dc.citation.endPage | 755 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.subject.keywordPlus | BANDGAP REFERENCE | - |
| dc.subject.keywordPlus | CMOS integrated circuits | - |
| dc.subject.keywordPlus | Dielectric devices | - |
| dc.subject.keywordPlus | Integrated circuit design | - |
| dc.subject.keywordPlus | Metallic compounds | - |
| dc.subject.keywordPlus | Metals | - |
| dc.subject.keywordPlus | MOS devices | - |
| dc.subject.keywordPlus | Oxide semiconductors | - |
| dc.subject.keywordPlus | Transistors | - |
| dc.subject.keywordPlus | Voltage measurement | - |
| dc.subject.keywordAuthor | 1st order voltage reference | - |
| dc.subject.keywordAuthor | temperature compensation | - |
| dc.subject.keywordAuthor | temperature coefficient | - |
| dc.subject.keywordAuthor | nonlinearity of base-emitter voltage | - |
| dc.identifier.url | https://www.jstage.jst.go.jp/article/transele/E91.C/5/E91.C_5_751/_article | - |
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