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Improvement of the imaging resolution for a Compton camera by determination of the interaction depth in a 25-segmented germanium detector

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dc.contributor.authorJung, Hyo Soon-
dc.contributor.authorLee, Ju Hahn-
dc.contributor.authorKwon, Young Kwan-
dc.contributor.authorSeo, Hee-
dc.contributor.authorKim, Chan Hyeong-
dc.contributor.authorLee, Chun Sik-
dc.date.accessioned2022-12-21T05:43:32Z-
dc.date.available2022-12-21T05:43:32Z-
dc.date.created2022-09-16-
dc.date.issued2007-10-
dc.identifier.issn1095-7863-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/179452-
dc.description.abstractThe imaging resolution in a Compton camera depends mainly on the position uncertainty, which is affected by the size of electrodes in a detector. Therefore, if any other method is not used for the reduction of the position uncertainty, the imaging resolution is limited by the size of electrodes. Recently, we have developed a Compton camera consisting of a double-sided silicon strip detector (DSSD) and a 25-segmented germanium detector (25-SEGD). The 25-SEGD has an active volume of 5 × 5 × 2 cm3. We have performed measurement for determination of the interaction depth in the 25-SEGD using the pulse shape analysis. After getting a rise-time correlation between the anode and the segment, we obtained a relation formula between the rise-time of the detector signal and the depth derived from the decay equation of gamma-ray in the detector. This decay formula has been used for the determination of interaction depth. As a result of applying the relation function to image reconstruction, we could improve the imaging resolution.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-
dc.titleImprovement of the imaging resolution for a Compton camera by determination of the interaction depth in a 25-segmented germanium detector-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Chan Hyeong-
dc.identifier.doi10.1109/NSSMIC.2007.4437080-
dc.identifier.scopusid2-s2.0-48149084961-
dc.identifier.bibliographicCitationIEEE Nuclear Science Symposium Conference Record, v.6, pp.4364 - 4366-
dc.relation.isPartOfIEEE Nuclear Science Symposium Conference Record-
dc.citation.titleIEEE Nuclear Science Symposium Conference Record-
dc.citation.volume6-
dc.citation.startPage4364-
dc.citation.endPage4366-
dc.type.rimsART-
dc.type.docTypeConference Paper-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusCameras-
dc.subject.keywordPlusDetectors-
dc.subject.keywordPlusElectrodes-
dc.subject.keywordPlusGermanium-
dc.subject.keywordPlusImaging techniques-
dc.subject.keywordPlusLaws and legislation-
dc.subject.keywordPlusMetallizing-
dc.subject.keywordPlusNonmetals-
dc.subject.keywordPlusSilicon-
dc.subject.keywordPlusSilicon sensors-
dc.subject.keywordPlusCompton cameras-
dc.subject.keywordPlusDouble-sided silicon strip detector-
dc.subject.keywordPlusGermanium detectors-
dc.subject.keywordPlusImaging resolutions-
dc.subject.keywordPlusInteraction depth-
dc.subject.keywordPlusNuclear sciences-
dc.subject.keywordPlusMedical imaging-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/4437080/-
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