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Characteristics of the interfacial microstructure of chip-on-plastic joints under thermal cycling and aging treatment

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dc.contributor.authorChen, Zhi Gang-
dc.contributor.authorKim, Young Ho-
dc.date.accessioned2022-12-21T09:34:34Z-
dc.date.available2022-12-21T09:34:34Z-
dc.date.created2022-08-26-
dc.date.issued2007-01-
dc.identifier.issn0361-5235-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/180585-
dc.description.abstractThis study presents the change of contact resistance and microstructure evolution of chip-on-plastic (COP) joints during the thermal cycling (T/C) test and aging treatment. Results showed that the average contact resistance of COP joints decreased in the early stage of the T/C test as well as during aging treatment. It was observed that after 1,000 h of aging, the (Cu, Au)(3)Sn phase was completely consumed and transformed into (Cu, Au)(6)Sn-5. The dependence of the growth of interfacial intermetallic compounds (IMCs) on the time of T/C and aging was investigated. The IMC growth had parabolic kinetics with time. The time exponent n under the condition of T/C was approximately 0.5, which indicated that the IMC growth was diffusion controlled. However, the fitting results on the aging treatment showed that n was only about 0.37. The reason for this finding is considered to be due to the fact that after 250 h, the Cu in some areas was depleted; thus, the diffusion in these areas was restrained.-
dc.language영어-
dc.language.isoen-
dc.publisherSPRINGER-
dc.titleCharacteristics of the interfacial microstructure of chip-on-plastic joints under thermal cycling and aging treatment-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Young Ho-
dc.identifier.doi10.1007/s11664-006-0022-3-
dc.identifier.scopusid2-s2.0-33947526383-
dc.identifier.wosid000244464400007-
dc.identifier.bibliographicCitationJOURNAL OF ELECTRONIC MATERIALS, v.36, no.1, pp.45 - 55-
dc.relation.isPartOfJOURNAL OF ELECTRONIC MATERIALS-
dc.citation.titleJOURNAL OF ELECTRONIC MATERIALS-
dc.citation.volume36-
dc.citation.number1-
dc.citation.startPage45-
dc.citation.endPage55-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusINTERMETALLIC COMPOUNDS-
dc.subject.keywordPlusSOLDER JOINTS-
dc.subject.keywordPlusCU-
dc.subject.keywordPlusRELIABILITY-
dc.subject.keywordPlusGROWTH-
dc.subject.keywordPlusSTRENGTH-
dc.subject.keywordAuthorflip chip-
dc.subject.keywordAuthornonconductive adhesives (NCAs)-
dc.subject.keywordAuthorthermal cycling (T/C)-
dc.subject.keywordAuthoraging-
dc.subject.keywordAuthorintermetallic compounds (IMCs)-
dc.identifier.urlhttps://link.springer.com/article/10.1007/s11664-006-0022-3-
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