Advanced technologies for estimation of nonlinear ultrasonic parameter
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Jhang, Kyung Young | - |
dc.contributor.author | Sasaki, Kimio | - |
dc.contributor.author | Ha, Job | - |
dc.contributor.author | Tanaka, Hiroaki | - |
dc.date.accessioned | 2022-12-21T09:38:49Z | - |
dc.date.available | 2022-12-21T09:38:49Z | - |
dc.date.created | 2022-09-16 | - |
dc.date.issued | 2006-12 | - |
dc.identifier.issn | 1013-9826 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/180626 | - |
dc.description.abstract | This paper proposes an advanced signal processing technique for the precise estimation of a nonlinear ultrasonic parameter, based on power spectral and bispectral analysis. The power spectrum and bispectrum estimation of the pulse-like ultrasonic signal used in the commercial SAM (scanning acoustic microscopy) equipment is especially considered in this study. The usefulness of the proposed estimation is confirmed by experiments for a Newton ring with a continuous air gap and a real semiconductor sample with local delaminations. The results show that the nonlinear parameter obtained by the proposed method had a good correlation with the delamination. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Trans Tech Publications Ltd | - |
dc.title | Advanced technologies for estimation of nonlinear ultrasonic parameter | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Jhang, Kyung Young | - |
dc.identifier.doi | 10.4028/www.scientific.net/KEM.326-328.673 | - |
dc.identifier.scopusid | 2-s2.0-33751511216 | - |
dc.identifier.bibliographicCitation | Key Engineering Materials, v.326-328 I, pp.673 - 676 | - |
dc.relation.isPartOf | Key Engineering Materials | - |
dc.citation.title | Key Engineering Materials | - |
dc.citation.volume | 326-328 I | - |
dc.citation.startPage | 673 | - |
dc.citation.endPage | 676 | - |
dc.type.rims | ART | - |
dc.type.docType | Conference Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | Microscopic examination | - |
dc.subject.keywordPlus | Semiconductor materials | - |
dc.subject.keywordPlus | Signal processing | - |
dc.subject.keywordPlus | Spectrum analysis | - |
dc.subject.keywordPlus | Ultrasonic applications | - |
dc.subject.keywordPlus | Bispectrum | - |
dc.subject.keywordPlus | Nonlinear parameters | - |
dc.subject.keywordPlus | Periodograms | - |
dc.subject.keywordPlus | Power spectra | - |
dc.subject.keywordPlus | Scanning acoustic microscopy (SAM) | - |
dc.subject.keywordPlus | Ultrasonic nonlinearity | - |
dc.subject.keywordPlus | Parameter estimation | - |
dc.subject.keywordAuthor | Bispectrum | - |
dc.subject.keywordAuthor | Nonlinear parameter | - |
dc.subject.keywordAuthor | Periodogram | - |
dc.subject.keywordAuthor | Power spectrum | - |
dc.subject.keywordAuthor | Signal processing | - |
dc.subject.keywordAuthor | Ultrasonic nonlinearity | - |
dc.identifier.url | https://www.scientific.net/KEM.326-328.673 | - |
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