Application of low-energy secondary emission electron gun for VOC treatment
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Fukamachi, Asuna | - |
dc.contributor.author | Watanabe, Masato | - |
dc.contributor.author | Okino, Akitoshi | - |
dc.contributor.author | Ko, Kwang Cheol | - |
dc.contributor.author | Hotta, Eiki | - |
dc.date.accessioned | 2022-12-21T10:19:01Z | - |
dc.date.available | 2022-12-21T10:19:01Z | - |
dc.date.created | 2022-09-16 | - |
dc.date.issued | 2006-09 | - |
dc.identifier.issn | 1093-2941 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/181011 | - |
dc.description.abstract | Non-thermal plasma technologies using electrical discharges or electron beam irradiation offer an energy- and cost-efficient approach to the decomposition of gaseous compounds. We have developed a low-energy secondary emission electron gun (SEEG) using wire ion plasma source (WIPS) for gaseous pollutant treatment. The devise has some inherent advantages such as compact in size, wide and uniform electron beam. In this work, divergence of electron beam energy was measured and NO removal characteristics have been studied under increasing gun voltage and changing dimension of gas treatment chamber. It has been observed that the smaller chamber gives better removal efficiency of NO and we are trying to apply this device to VOC treatment. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IEEE | - |
dc.title | Application of low-energy secondary emission electron gun for VOC treatment | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Ko, Kwang Cheol | - |
dc.identifier.doi | 10.1109/DEIV.2006.357387 | - |
dc.identifier.scopusid | 2-s2.0-47349132638 | - |
dc.identifier.bibliographicCitation | Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV, v.2, pp.654 - 657 | - |
dc.relation.isPartOf | Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV | - |
dc.citation.title | Proceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV | - |
dc.citation.volume | 2 | - |
dc.citation.startPage | 654 | - |
dc.citation.endPage | 657 | - |
dc.type.rims | ART | - |
dc.type.docType | Conference Paper | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scopus | - |
dc.subject.keywordPlus | Arsenic compounds | - |
dc.subject.keywordPlus | Discharge (fluid mechanics) | - |
dc.subject.keywordPlus | Electric discharges | - |
dc.subject.keywordPlus | Electron beam lithography | - |
dc.subject.keywordPlus | Electron beams | - |
dc.subject.keywordPlus | Electron irradiation | - |
dc.subject.keywordPlus | Electron tubes | - |
dc.subject.keywordPlus | Electrons | - |
dc.subject.keywordPlus | Fluid mechanics | - |
dc.subject.keywordPlus | Fog | - |
dc.subject.keywordPlus | Guns (armament) | - |
dc.subject.keywordPlus | Particle beams | - |
dc.subject.keywordPlus | Plasma guns | - |
dc.subject.keywordPlus | Plasmas | - |
dc.subject.keywordPlus | Removal | - |
dc.subject.keywordPlus | Secondary emission | - |
dc.subject.keywordPlus | Vacuum | - |
dc.subject.keywordPlus | Volatile organic compounds | - |
dc.subject.keywordPlus | Cost-efficient | - |
dc.subject.keywordPlus | Electrical discharges | - |
dc.subject.keywordPlus | Electrical insulation | - |
dc.subject.keywordPlus | Electron beam energies | - |
dc.subject.keywordPlus | Electron beam irradiation (EBI) | - |
dc.subject.keywordPlus | Gas treatment | - |
dc.subject.keywordPlus | Gaseous compounds | - |
dc.subject.keywordPlus | In-vacuum | - |
dc.subject.keywordPlus | International symposium | - |
dc.subject.keywordPlus | Ion plasmas | - |
dc.subject.keywordPlus | Low energies | - |
dc.subject.keywordPlus | NO removal | - |
dc.subject.keywordPlus | Non-thermal plasma (NTP) | - |
dc.subject.keywordPlus | Removal efficiency (RE) | - |
dc.subject.keywordPlus | Electron guns | - |
dc.identifier.url | https://ieeexplore.ieee.org/document/4194968 | - |
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