Measuring the surface temperature of light-emitting diodes by thermoreflectance
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Zheng, Dong-Guang | - |
dc.contributor.author | Shin, Dong Soo | - |
dc.contributor.author | Shim, Jong-In | - |
dc.date.accessioned | 2023-07-27T12:16:28Z | - |
dc.date.available | 2023-07-27T12:16:28Z | - |
dc.date.created | 2023-05-30 | - |
dc.date.issued | 2021-05 | - |
dc.identifier.issn | 0021-4922 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/188365 | - |
dc.description.abstract | As the latest applications of LEDs require more harsh operating conditions, understanding the device thermal properties becomes more essential for further improving the device efficiencies. In applications where heat dissipation can be a critical issue, thermoreflectance (TR) can be utilized as a useful noncontact measurement technique for analyzing the thermal properties. In this paper, we investigate the TR method of measuring the surface temperature, using a lateral-type blue LED chip under high-power operation. The TR we employ measures the change in reflectivity from the Au metal electrode. By comparing with surface/junction temperatures measured by other methods based on the thermocouple and the forward voltage, we find that the TR method can provide accurate and reliable results of measuring the surface temperature of modern LEDs. A useful insight can also be obtained from the temperature distribution on the LED chip surface. (c) 2021 The Japan Society of Applied Physics | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | IOP Publishing Ltd | - |
dc.title | Measuring the surface temperature of light-emitting diodes by thermoreflectance | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Shin, Dong Soo | - |
dc.identifier.doi | 10.35848/1347-4065/abf90c | - |
dc.identifier.scopusid | 2-s2.0-85105735810 | - |
dc.identifier.wosid | 000647276900001 | - |
dc.identifier.bibliographicCitation | Japanese Journal of Applied Physics, v.60, no.5, pp.1 - 7 | - |
dc.relation.isPartOf | Japanese Journal of Applied Physics | - |
dc.citation.title | Japanese Journal of Applied Physics | - |
dc.citation.volume | 60 | - |
dc.citation.number | 5 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 7 | - |
dc.type.rims | ART | - |
dc.type.docType | 정기학술지(Article(Perspective Article포함)) | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | THERMOGRAPHY | - |
dc.subject.keywordPlus | VOLTAGE | - |
dc.subject.keywordPlus | SYSTEM | - |
dc.subject.keywordAuthor | Light-emitting diodes | - |
dc.subject.keywordAuthor | Thermoreflectance | - |
dc.subject.keywordAuthor | Junction temperature | - |
dc.subject.keywordAuthor | Surface temperature | - |
dc.identifier.url | https://iopscience.iop.org/article/10.35848/1347-4065/abf90c | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1365
COPYRIGHT © 2021 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.