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Utilizing VO2 as a Hole Injection Layer for Efficient Charge Injection in Quantum Dot Light-Emitting Diodes Enables High Device Performance

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dc.contributor.authorCho, Han Bin-
dc.contributor.authorHan, Ju Yeon-
dc.contributor.authorKim, Ha Jun-
dc.contributor.authorViswanath, Noolu Srinivasa Manikanta-
dc.contributor.authorPark, Yong Min-
dc.contributor.authorMin, Jeong Wan-
dc.contributor.authorJang, Sung Woo-
dc.contributor.authorYang, Heesun-
dc.contributor.authorIm, Won Bin-
dc.date.accessioned2023-11-24T05:17:02Z-
dc.date.available2023-11-24T05:17:02Z-
dc.date.created2023-06-26-
dc.date.issued2023-06-
dc.identifier.issn1944-8244-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/193086-
dc.description.abstractQuantum dot light-emitting diodes(QLEDs) are promising devicesfor display applications. Polyethylenedioxythiophene:polystyrene sulfonate(PEDOT:PSS) is a common hole injection layer (HIL) material in optoelectronicdevices because of its high conductivity and high work function. Nevertheless,PEDOT:PSS-based QLEDs have a high energy barrier for hole injection,which results in low device efficiency. Therefore, a new strategyis needed to improve the device efficiency. Herein, we have demonstrateda bilayer-HIL using VO2 and a PEDOT:PSS-based QLED thatexhibits an 18% external quantum efficiency (EQE), 78 cd/A currentefficiency (CE), and 25,771 cd/m(2) maximum luminance. Incontrast, the PEDOT:PSS-based QLED exhibits an EQE of 13%, CE of 54cd/A, and maximum luminance of 14,817 cd/m(2). An increasein EQE was attributed to a reduction in the energy barrier betweenindium tin oxide (ITO) and PEDOT:PSS, caused by the insertion of aVO(2) HIL. Therefore, our results could demonstrate thatusing a bilayer-HIL is effective in increasing the EQE in QLEDs.-
dc.language영어-
dc.language.isoen-
dc.publisherAMER CHEMICAL SOC-
dc.titleUtilizing VO2 as a Hole Injection Layer for Efficient Charge Injection in Quantum Dot Light-Emitting Diodes Enables High Device Performance-
dc.typeArticle-
dc.contributor.affiliatedAuthorIm, Won Bin-
dc.identifier.doi10.1021/acsami.3c02857-
dc.identifier.scopusid2-s2.0-85163754206-
dc.identifier.wosid001003400200001-
dc.identifier.bibliographicCitationACS APPLIED MATERIALS & INTERFACES, v.15, no.24, pp.29259 - 29266-
dc.relation.isPartOfACS APPLIED MATERIALS & INTERFACES-
dc.citation.titleACS APPLIED MATERIALS & INTERFACES-
dc.citation.volume15-
dc.citation.number24-
dc.citation.startPage29259-
dc.citation.endPage29266-
dc.type.rimsART-
dc.type.docTypeArticle; Early Access-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaScience & Technology - Other Topics-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryNanoscience & Nanotechnology-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.subject.keywordPlusOXIDE-
dc.subject.keywordPlusFILMS-
dc.subject.keywordAuthorvanadium dioxide-
dc.subject.keywordAuthorhole injection layer-
dc.subject.keywordAuthorrapidthermal annealing-
dc.subject.keywordAuthorthermal stability-
dc.subject.keywordAuthorlight extraction-
dc.subject.keywordAuthorquantum dot light-emitting diodes-
dc.identifier.urlhttps://pubs.acs.org/doi/10.1021/acsami.3c02857-
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