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Overcoming Hardware Imperfections in Optical Neural Networks through a Machine Learning-Driven Self-Correction Mechanism

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dc.contributor.authorKim, Minjoo-
dc.contributor.authorKim, Beomju-
dc.contributor.authorKim, Yelim-
dc.contributor.authorHandriani, Lia Saptini-
dc.contributor.authorJang, Suhee-
dc.contributor.authorJeong, Dae Yeop-
dc.contributor.authorYang, Sung Ik-
dc.contributor.authorPark, Won Il-
dc.date.accessioned2024-11-28T08:27:54Z-
dc.date.available2024-11-28T08:27:54Z-
dc.date.issued2024-04-
dc.identifier.issn1943-0655-
dc.identifier.issn1943-0647-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/195160-
dc.description.abstractWe developed an optical neural network (ONN) for efficient processing and recognition of 2-dimensional (2D) images, employing a conventional liquid crystal display panel as optical neurons and synapses. This configuration allowed for optical signal outputs proportional to matrix-vector multiplication for 2D image inputs. However, our experimental results revealed a 26.6% decrease in the optical classification accuracy, despite utilizing digitally pre-trained parameters with 100% accuracy for 500 handwritten digits. This decline can be attributed to system imperfections associated with non-ideal functions of optical components and optical alignment. Rather than pursuing an elusive, imperfection-free ONN or attempting to calibrate these defects individually, we addressed these challenges by introducing a self-correction mechanism that utilizes a machine learning algorithm. This approach effectively restored the recognition accuracy and minimized loss of our ONN to levels comparable to the digitally pre-trained model. This study underscores the potential of constructing defect-tolerant hardware in ONNs through the application of machine learning techniques.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical and Electronics Engineers-
dc.titleOvercoming Hardware Imperfections in Optical Neural Networks through a Machine Learning-Driven Self-Correction Mechanism-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/JPHOT.2024.3361930-
dc.identifier.scopusid2-s2.0-85184803798-
dc.identifier.wosid001177557100003-
dc.identifier.bibliographicCitationIEEE Photonics Journal, v.16, no.2, pp 1 - 8-
dc.citation.titleIEEE Photonics Journal-
dc.citation.volume16-
dc.citation.number2-
dc.citation.startPage1-
dc.citation.endPage8-
dc.type.docTypeArticle-
dc.description.isOpenAccessY-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaOptics-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryOptics-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusOFDM-
dc.subject.keywordAuthorAdaptive optics-
dc.subject.keywordAuthorHardware-
dc.subject.keywordAuthorHardware imperfections-
dc.subject.keywordAuthorImage color analysis-
dc.subject.keywordAuthorMatrix-Vector Multiplication (MVM)-
dc.subject.keywordAuthorOptical computing-
dc.subject.keywordAuthorOptical crosstalk-
dc.subject.keywordAuthorOptical imaging-
dc.subject.keywordAuthorOptical Neural Networks (ONNs)-
dc.subject.keywordAuthorRecognition accuracy-
dc.subject.keywordAuthorSelf-correction approach-
dc.subject.keywordAuthorTraining-
dc.subject.keywordAuthorTraining algorithm-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/10420458-
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