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A 50 ms/s First-Order Mismatch Error Shaping and Third-Order Noise-Shaping SAR ADC for IOT Applications

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dc.contributor.authorJang, Jin-Yeop-
dc.contributor.authorPark, Sang-Gyu-
dc.date.accessioned2024-11-28T12:31:47Z-
dc.date.available2024-11-28T12:31:47Z-
dc.date.issued2023-11-
dc.identifier.issn2374-0272-
dc.identifier.issn2575-4955-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/196317-
dc.description.abstractThis article presents a first order Mismatch Error Shaping (MES) and third-order Noise Shaping (NS) Successive Approximation Register (SAR) analog to digital converter (ADC). We choose fully dynamic hardware reusing (HR) error feedback, cascade of integrators with feed forward (EF-CIFF) structure to reduce the power consumption, and to increase the sampling speed. In addition, to enhance the resolution, a MES scheme with two-level digital prediction is implemented to remove the distortion caused by the capacitive digital to analog converter (CDAC) mismatch. The SPICE level simulations of the proposed ADC implemented using a 28-nm CMOS process show 85 dB signal-to-noise-distortion ratio (SNDR) with 1.56 MHz bandwidth (oversampling ratio (OSR) = 16).-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical and Electronics Engineers Inc.-
dc.titleA 50 ms/s First-Order Mismatch Error Shaping and Third-Order Noise-Shaping SAR ADC for IOT Applications-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/IC-NIDC59918.2023.10390566-
dc.identifier.scopusid2-s2.0-85184796956-
dc.identifier.bibliographicCitationProceedings of 2023 8th IEEE International Conference on Network Intelligence and Digital Content, IC-NIDC 2023, pp 481 - 485-
dc.citation.titleProceedings of 2023 8th IEEE International Conference on Network Intelligence and Digital Content, IC-NIDC 2023-
dc.citation.startPage481-
dc.citation.endPage485-
dc.type.docTypeConference paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusDigital-to-analog converters-
dc.subject.keywordPlusError feedback-
dc.subject.keywordPlusFeed forward-
dc.subject.keywordPlusHardware reusing error feedback, cascade of integrator with feed forward structure-
dc.subject.keywordPlusMismatch error shaping-
dc.subject.keywordPlusMismatch errors-
dc.subject.keywordPlusNoise-shaped successive approximation register analog to digital converter-
dc.subject.keywordPlusSplit capacitor array digital to analog converter-
dc.subject.keywordPlusSplit-capacitor arrays-
dc.subject.keywordPlusSuccessive approximation register analog-to-digital converter-
dc.subject.keywordPlusTwo-level digital prediction-
dc.subject.keywordAuthorHardware Reusing EF-CIFF Structure-
dc.subject.keywordAuthorMismatch Error Shaping (MES)-
dc.subject.keywordAuthorNoise-Shaped SAR ADC-
dc.subject.keywordAuthorSplit Capacitor Array Digital to Analog Converter (DAC)-
dc.subject.keywordAuthorTwo-Level Digital Prediction-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/10390566-
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