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GEBA: Gradient-Error-Based Approximation of Activation Functions

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dc.contributor.author예창민-
dc.contributor.authorJeong, Doo Seok-
dc.date.accessioned2024-11-28T15:01:34Z-
dc.date.available2024-11-28T15:01:34Z-
dc.date.issued2023-12-
dc.identifier.issn2156-3357-
dc.identifier.issn2156-3365-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/197096-
dc.description.abstractComputing-in-memory (CIM) macros aiming at accelerating deep learning operations at low power need activation function (AF) units on the same die to reduce their host-dependency. Versatile CIM macros need to include reconfigurable AF units at high precision and high efficiency in hardware usage. To this end, we propose the gradient-error-based approximation (GEBA) of AFs, which approximates various types of AFs in discrete input domains at high precision. GEBA reduces the approximation error by ca. 49.7%, 67.3%, 81.4%, 60.1% (for sigmoid, tanh, GELU, swish in FP32), compared with the uniform input-based approximation using the same memory as GEBA.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE Circuits and Systems Society-
dc.titleGEBA: Gradient-Error-Based Approximation of Activation Functions-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/JETCAS.2023.3328890-
dc.identifier.scopusid2-s2.0-85181557065-
dc.identifier.wosid001134508400003-
dc.identifier.bibliographicCitationIEEE Journal on Emerging and Selected Topics in Circuits and Systems, v.13, no.4, pp 1106 - 1113-
dc.citation.titleIEEE Journal on Emerging and Selected Topics in Circuits and Systems-
dc.citation.volume13-
dc.citation.number4-
dc.citation.startPage1106-
dc.citation.endPage1113-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusChemical activation-
dc.subject.keywordPlusComputer hardware-
dc.subject.keywordPlusDeep learning-
dc.subject.keywordPlusErrors-
dc.subject.keywordAuthorActivation function-
dc.subject.keywordAuthoractivation function approximation-
dc.subject.keywordAuthorcomputing-in-memory-
dc.subject.keywordAuthorgradient-error-based approximation-
dc.subject.keywordAuthorlookup table-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/10302226-
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COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)
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