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In-situ Spectroscopic Analysis of Surface Doping on 2D MoS2 for Channel Materials
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 최선진 | - |
| dc.date.accessioned | 2024-12-05T18:30:26Z | - |
| dc.date.available | 2024-12-05T18:30:26Z | - |
| dc.date.issued | 2023-11-20 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/201215 | - |
| dc.title | In-situ Spectroscopic Analysis of Surface Doping on 2D MoS2 for Channel Materials | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | Korean International Conference on Semiconductor Manufacturing Technology (KISM 2023) | - |
| dc.citation.conferencePlace | 부산 파라다이스 호텔 | - |
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Collections - 서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers
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Related Researcher
- Choi, Seon-Jin
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)