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Spatially offset based Raman scattering-based line-mapping as means to determine sample particle size
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정회일 | - |
| dc.date.accessioned | 2021-08-02T14:59:31Z | - |
| dc.date.available | 2021-08-02T14:59:31Z | - |
| dc.date.created | 2021-06-30 | - |
| dc.date.issued | 2019-04-17 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/20138 | - |
| dc.publisher | 대한화학회 | - |
| dc.title | Spatially offset based Raman scattering-based line-mapping as means to determine sample particle size | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 정회일 | - |
| dc.identifier.bibliographicCitation | 제 123회 대한화학회 | - |
| dc.relation.isPartOf | 제 123회 대한화학회 | - |
| dc.citation.title | 제 123회 대한화학회 | - |
| dc.citation.conferencePlace | 수원 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 2 | - |
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Collections - 서울 자연과학대학 > 서울 화학과 > 2. Conference Papers
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Related Researcher
- Chung, Hoeil
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF CHEMISTRY)