Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Reliability Analysis of SiGe-HBT Low-Noise Amplifier under RF Stress
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 송익현 | - |
| dc.date.accessioned | 2024-12-05T22:00:23Z | - |
| dc.date.available | 2024-12-05T22:00:23Z | - |
| dc.date.issued | 2024-08-23 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/201651 | - |
| dc.title | Reliability Analysis of SiGe-HBT Low-Noise Amplifier under RF Stress | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 한국전자파학회 하계학술대회 | - |
| dc.citation.conferencePlace | 평창 강원도 | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Song, Ickhyun
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)