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An eco-friendly Cu-Zn wetting layer for highly reliable solder joints

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dc.contributor.authorKim, Young Min-
dc.contributor.authorKim, Sun-Chul-
dc.contributor.authorKim, Young-Ho-
dc.date.accessioned2024-12-20T06:25:56Z-
dc.date.available2024-12-20T06:25:56Z-
dc.date.issued2013-08-
dc.identifier.issn0569-5503-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/202843-
dc.description.abstractWe successfully fabricated an eco-friendly Cu-Zn wetting layer for Sn-Ag-Cu (SAC) solders by electroplating in a cyanide-free solution. The reliabilities of solder joints formed on the Cu-Zn solder wetting layer were evaluated through the drop impact test and thermal cycling (T/C) test. First, boardlevel drop impact test was performed with the SAC solder joints formed on electroplated Cu or Cu-Zn layers. Drop test samples were fabricated by connecting SAC solders with Cu or Cu-20 wt% Zn wetting layer formed on printed circuit boards (PCBs). Cu-20 wt% Zn layers were electroplated in cyanide and cyanide-free solutions. Drop impact resistance of Cu-Zn/SAC/Cu-Zn solder joints was superior to that of Cu/SAC/Cu solder joints. Next, for T/C test, Cu pillar bumps with Sn-2.5 wt% Ag capping layers were fabricated on Si chip and joined with Cu or Cu-Zn layer on PCB substrate by flip chip bonding. T/C test was carried out between -55°C and 125°C up to 3000 cycles. The flip chip joints formed on either Cu or Cu-Zn layer showed excellent T/C reliability in the underfilled condition. The failure was not observed in both samples after 3000 cycles. When underfill was not applied in the flip chip joints, Cu-Zn samples exhibited better results than Cu samples even though both samples had short thermal fatigue life. The improvement of reliability in Cu-Zn samples was ascribed to the beneficial effect of Zn. Our results implied that electroplating of Cu-Zn layers in a cyanide-free solution was successful and the reliability of solder joints can be enhanced by applying a Cu-Zn solder wetting layer.-
dc.format.extent6-
dc.language영어-
dc.language.isoENG-
dc.titleAn eco-friendly Cu-Zn wetting layer for highly reliable solder joints-
dc.typeArticle-
dc.identifier.doi10.1109/ECTC.2013.6575657-
dc.identifier.scopusid2-s2.0-84883331825-
dc.identifier.bibliographicCitationProceedings - Electronic Components and Technology Conference, pp 755 - 760-
dc.citation.titleProceedings - Electronic Components and Technology Conference-
dc.citation.startPage755-
dc.citation.endPage760-
dc.type.docTypeConference Paper-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscopus-
dc.subject.keywordPlusBeneficial effects-
dc.subject.keywordPlusCapping layer-
dc.subject.keywordPlusDrop impact tests-
dc.subject.keywordPlusFlip chip bonding-
dc.subject.keywordPlusFlip chip joints-
dc.subject.keywordPlusPrinted circuit board (PCBs)-
dc.subject.keywordPlusSolder joints-
dc.subject.keywordPlusSolder wetting-
dc.subject.keywordPlusCyanides-
dc.subject.keywordPlusDrops-
dc.subject.keywordPlusElectroplating-
dc.subject.keywordPlusEnvironmental protection-
dc.subject.keywordPlusFabrication-
dc.subject.keywordPlusFatigue of materials-
dc.subject.keywordPlusFlip chip devices-
dc.subject.keywordPlusOrganic pollutants-
dc.subject.keywordPlusPolychlorinated biphenyls-
dc.subject.keywordPlusPrinted circuit boards-
dc.subject.keywordPlusReliability-
dc.subject.keywordPlusSilver-
dc.subject.keywordPlusSoldering alloys-
dc.subject.keywordPlusWetting-
dc.subject.keywordPlusZinc-
dc.subject.keywordPlusTin-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/6575657-
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