Cited 0 time in
An eco-friendly Cu-Zn wetting layer for highly reliable solder joints
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Young Min | - |
| dc.contributor.author | Kim, Sun-Chul | - |
| dc.contributor.author | Kim, Young-Ho | - |
| dc.date.accessioned | 2024-12-20T06:25:56Z | - |
| dc.date.available | 2024-12-20T06:25:56Z | - |
| dc.date.issued | 2013-08 | - |
| dc.identifier.issn | 0569-5503 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/202843 | - |
| dc.description.abstract | We successfully fabricated an eco-friendly Cu-Zn wetting layer for Sn-Ag-Cu (SAC) solders by electroplating in a cyanide-free solution. The reliabilities of solder joints formed on the Cu-Zn solder wetting layer were evaluated through the drop impact test and thermal cycling (T/C) test. First, boardlevel drop impact test was performed with the SAC solder joints formed on electroplated Cu or Cu-Zn layers. Drop test samples were fabricated by connecting SAC solders with Cu or Cu-20 wt% Zn wetting layer formed on printed circuit boards (PCBs). Cu-20 wt% Zn layers were electroplated in cyanide and cyanide-free solutions. Drop impact resistance of Cu-Zn/SAC/Cu-Zn solder joints was superior to that of Cu/SAC/Cu solder joints. Next, for T/C test, Cu pillar bumps with Sn-2.5 wt% Ag capping layers were fabricated on Si chip and joined with Cu or Cu-Zn layer on PCB substrate by flip chip bonding. T/C test was carried out between -55°C and 125°C up to 3000 cycles. The flip chip joints formed on either Cu or Cu-Zn layer showed excellent T/C reliability in the underfilled condition. The failure was not observed in both samples after 3000 cycles. When underfill was not applied in the flip chip joints, Cu-Zn samples exhibited better results than Cu samples even though both samples had short thermal fatigue life. The improvement of reliability in Cu-Zn samples was ascribed to the beneficial effect of Zn. Our results implied that electroplating of Cu-Zn layers in a cyanide-free solution was successful and the reliability of solder joints can be enhanced by applying a Cu-Zn solder wetting layer. | - |
| dc.format.extent | 6 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.title | An eco-friendly Cu-Zn wetting layer for highly reliable solder joints | - |
| dc.type | Article | - |
| dc.identifier.doi | 10.1109/ECTC.2013.6575657 | - |
| dc.identifier.scopusid | 2-s2.0-84883331825 | - |
| dc.identifier.bibliographicCitation | Proceedings - Electronic Components and Technology Conference, pp 755 - 760 | - |
| dc.citation.title | Proceedings - Electronic Components and Technology Conference | - |
| dc.citation.startPage | 755 | - |
| dc.citation.endPage | 760 | - |
| dc.type.docType | Conference Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.subject.keywordPlus | Beneficial effects | - |
| dc.subject.keywordPlus | Capping layer | - |
| dc.subject.keywordPlus | Drop impact tests | - |
| dc.subject.keywordPlus | Flip chip bonding | - |
| dc.subject.keywordPlus | Flip chip joints | - |
| dc.subject.keywordPlus | Printed circuit board (PCBs) | - |
| dc.subject.keywordPlus | Solder joints | - |
| dc.subject.keywordPlus | Solder wetting | - |
| dc.subject.keywordPlus | Cyanides | - |
| dc.subject.keywordPlus | Drops | - |
| dc.subject.keywordPlus | Electroplating | - |
| dc.subject.keywordPlus | Environmental protection | - |
| dc.subject.keywordPlus | Fabrication | - |
| dc.subject.keywordPlus | Fatigue of materials | - |
| dc.subject.keywordPlus | Flip chip devices | - |
| dc.subject.keywordPlus | Organic pollutants | - |
| dc.subject.keywordPlus | Polychlorinated biphenyls | - |
| dc.subject.keywordPlus | Printed circuit boards | - |
| dc.subject.keywordPlus | Reliability | - |
| dc.subject.keywordPlus | Silver | - |
| dc.subject.keywordPlus | Soldering alloys | - |
| dc.subject.keywordPlus | Wetting | - |
| dc.subject.keywordPlus | Zinc | - |
| dc.subject.keywordPlus | Tin | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/6575657 | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366
COPYRIGHT © 2024 HANYANG UNIVERSITY.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.
