Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Learning-based Mutant Reduction Using Fine-grained Mutation Operators
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Yunho | - |
| dc.contributor.author | Hong, Shin | - |
| dc.date.accessioned | 2024-12-20T07:47:21Z | - |
| dc.date.available | 2024-12-20T07:47:21Z | - |
| dc.date.issued | 2022-04 | - |
| dc.identifier.issn | 2159-4848 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/203599 | - |
| dc.description.abstract | This is an extended abstract of the article: Yunho Kim and SHin Hong, Learning-based Mutant Reduction Using Fine-grained Mutation Operators, Journal of Software Testing, Verification and Reliability, e1786, https://doi.org/10.1002/stvr.1786 | - |
| dc.format.extent | 1 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers Inc. | - |
| dc.title | Learning-based Mutant Reduction Using Fine-grained Mutation Operators | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/ICST53961.2022.00065 | - |
| dc.identifier.scopusid | 2-s2.0-85133301295 | - |
| dc.identifier.wosid | 000850246600047 | - |
| dc.identifier.bibliographicCitation | Proceedings - 2022 IEEE 15th International Conference on Software Testing, Verification and Validation, ICST 2022, pp 464 - 464 | - |
| dc.citation.title | Proceedings - 2022 IEEE 15th International Conference on Software Testing, Verification and Validation, ICST 2022 | - |
| dc.citation.startPage | 464 | - |
| dc.citation.endPage | 464 | - |
| dc.type.docType | Proceedings Paper | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Computer Science | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Software Engineering | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Theory & Methods | - |
| dc.subject.keywordPlus | Cost reduction | - |
| dc.subject.keywordPlus | Software reliability | - |
| dc.subject.keywordPlus | Software testing | - |
| dc.subject.keywordPlus | Verification | - |
| dc.subject.keywordPlus | Abstracting | - |
| dc.subject.keywordPlus | reductions | - |
| dc.subject.keywordPlus | Cost-considerate linear regression | - |
| dc.subject.keywordPlus | Extended abstracts | - |
| dc.subject.keywordPlus | Fine grained | - |
| dc.subject.keywordPlus | Mutant reduction | - |
| dc.subject.keywordPlus | Mutation analysis | - |
| dc.subject.keywordPlus | Mutation operators | - |
| dc.subject.keywordPlus | Mutation score | - |
| dc.subject.keywordPlus | Mutation score prediction | - |
| dc.subject.keywordPlus | Software testings | - |
| dc.subject.keywordAuthor | Cost-considerate linear regression | - |
| dc.subject.keywordAuthor | Mutant reduction | - |
| dc.subject.keywordAuthor | Mutation analysis | - |
| dc.subject.keywordAuthor | Mutation operator | - |
| dc.subject.keywordAuthor | Mutation score prediction | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/9787829 | - |
- Files in This Item
- Go to Link
- Appears in
Collections - 서울 공과대학 > 서울 컴퓨터소프트웨어학부 > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Kim, Yunho
- COLLEGE OF ENGINEERING (SCHOOL OF COMPUTER SCIENCE)