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Thermomechanical Reliabilities of Pb-Free Solder Joints According to Ag Content in Harsh Environment
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Jemin | - |
| dc.contributor.author | Yoon, Dongweon | - |
| dc.date.accessioned | 2024-12-20T07:54:18Z | - |
| dc.date.available | 2024-12-20T07:54:18Z | - |
| dc.date.issued | 2023-12 | - |
| dc.identifier.issn | 0018-9529 | - |
| dc.identifier.issn | 1558-1721 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/203834 | - |
| dc.description.abstract | Pb-free solders based on Sn-Ag-Cu are currently applied to electronic devices. This article investigates the thermomechanical reliability of three different compositions of Pb-free solder joints, Sn-1.0Ag-0.5Cu, Sn-1.2Ag-0.5Cu, and Sn-3.0Ag-0.5Cu in a harsh environment. First, we perform a temperature cycling test(TCT) and a thermal shock test (TST) at temperatures from –55 to 125 °C. In addition, we conduct a combined thermal shock and vibration test (TSVT) using a HALT chamber, at –65 to 150 °C and an acceleration of up to (15 ± 1) Grms, considering the automotive underhood environment. We then analyze the mean lifetimes for each test of Pb-free solder joints dependent on the Ag contents. Finally, we present the lifetime ratios of three different Pb-free solders between TCT and TST, and show that SAC1205 has a similar mean lifetime to SAC305 within about 0.34% in combined TSVT. The results of this article could provide a reference for selecting suitable Pb-free solders in industrial use over harsh environments. | - |
| dc.format.extent | 9 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers | - |
| dc.title | Thermomechanical Reliabilities of Pb-Free Solder Joints According to Ag Content in Harsh Environment | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/TR.2023.3256405 | - |
| dc.identifier.scopusid | 2-s2.0-85151510224 | - |
| dc.identifier.wosid | 000966991000001 | - |
| dc.identifier.bibliographicCitation | IEEE Transactions on Reliability, v.72, no.4, pp 1610 - 1618 | - |
| dc.citation.title | IEEE Transactions on Reliability | - |
| dc.citation.volume | 72 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 1610 | - |
| dc.citation.endPage | 1618 | - |
| dc.type.docType | Article in press | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Computer Science | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Hardware & Architecture | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Software Engineering | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.subject.keywordPlus | BOARD-LEVEL RELIABILITY | - |
| dc.subject.keywordPlus | LEAD-FREE SOLDER | - |
| dc.subject.keywordPlus | MODEL | - |
| dc.subject.keywordAuthor | Combined thermal shock and vibration test (TSVT) | - |
| dc.subject.keywordAuthor | lifetime | - |
| dc.subject.keywordAuthor | Pb-free solder | - |
| dc.subject.keywordAuthor | Reliability | - |
| dc.subject.keywordAuthor | Sn-Ag-Cu | - |
| dc.subject.keywordAuthor | Soldering | - |
| dc.subject.keywordAuthor | Stress | - |
| dc.subject.keywordAuthor | Temperature measurement | - |
| dc.subject.keywordAuthor | Thermal shock | - |
| dc.subject.keywordAuthor | Thermomechanical processes | - |
| dc.subject.keywordAuthor | thermomechanical reliability | - |
| dc.subject.keywordAuthor | Vibrations | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/10079934 | - |
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