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Thermomechanical Reliabilities of Pb-Free Solder Joints According to Ag Content in Harsh Environment

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dc.contributor.authorKim, Jemin-
dc.contributor.authorYoon, Dongweon-
dc.date.accessioned2024-12-20T07:54:18Z-
dc.date.available2024-12-20T07:54:18Z-
dc.date.issued2023-12-
dc.identifier.issn0018-9529-
dc.identifier.issn1558-1721-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/203834-
dc.description.abstractPb-free solders based on Sn-Ag-Cu are currently applied to electronic devices. This article investigates the thermomechanical reliability of three different compositions of Pb-free solder joints, Sn-1.0Ag-0.5Cu, Sn-1.2Ag-0.5Cu, and Sn-3.0Ag-0.5Cu in a harsh environment. First, we perform a temperature cycling test(TCT) and a thermal shock test (TST) at temperatures from –55 to 125 °C. In addition, we conduct a combined thermal shock and vibration test (TSVT) using a HALT chamber, at –65 to 150 °C and an acceleration of up to (15 ± 1) Grms, considering the automotive underhood environment. We then analyze the mean lifetimes for each test of Pb-free solder joints dependent on the Ag contents. Finally, we present the lifetime ratios of three different Pb-free solders between TCT and TST, and show that SAC1205 has a similar mean lifetime to SAC305 within about 0.34% in combined TSVT. The results of this article could provide a reference for selecting suitable Pb-free solders in industrial use over harsh environments.-
dc.format.extent9-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical and Electronics Engineers-
dc.titleThermomechanical Reliabilities of Pb-Free Solder Joints According to Ag Content in Harsh Environment-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/TR.2023.3256405-
dc.identifier.scopusid2-s2.0-85151510224-
dc.identifier.wosid000966991000001-
dc.identifier.bibliographicCitationIEEE Transactions on Reliability, v.72, no.4, pp 1610 - 1618-
dc.citation.titleIEEE Transactions on Reliability-
dc.citation.volume72-
dc.citation.number4-
dc.citation.startPage1610-
dc.citation.endPage1618-
dc.type.docTypeArticle in press-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryComputer Science, Hardware & Architecture-
dc.relation.journalWebOfScienceCategoryComputer Science, Software Engineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusBOARD-LEVEL RELIABILITY-
dc.subject.keywordPlusLEAD-FREE SOLDER-
dc.subject.keywordPlusMODEL-
dc.subject.keywordAuthorCombined thermal shock and vibration test (TSVT)-
dc.subject.keywordAuthorlifetime-
dc.subject.keywordAuthorPb-free solder-
dc.subject.keywordAuthorReliability-
dc.subject.keywordAuthorSn-Ag-Cu-
dc.subject.keywordAuthorSoldering-
dc.subject.keywordAuthorStress-
dc.subject.keywordAuthorTemperature measurement-
dc.subject.keywordAuthorThermal shock-
dc.subject.keywordAuthorThermomechanical processes-
dc.subject.keywordAuthorthermomechanical reliability-
dc.subject.keywordAuthorVibrations-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/10079934-
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