Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
Wafer Notch Detection Algorithm Based on Improved YOLO-v4 Detection Model
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 문승재 | - |
| dc.date.accessioned | 2025-01-07T08:00:21Z | - |
| dc.date.available | 2025-01-07T08:00:21Z | - |
| dc.date.issued | 2024-11-06 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/204813 | - |
| dc.title | Wafer Notch Detection Algorithm Based on Improved YOLO-v4 Detection Model | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 대한기계학회 2024년 학술대회 | - |
| dc.citation.conferencePlace | 제주국제컨벤션센터(ICC제주) | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - 서울 공과대학 > 서울 기계공학부 > 2. Conference Papers
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
Related Researcher
- Moon, Seung Jae
- COLLEGE OF ENGINEERING (SCHOOL OF MECHANICAL ENGINEERING)