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Data Generation and Augmentation Method for Deep Learning-Based VDU Leakage Signal Restoration Algorithm
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Nam, Taesik | - |
| dc.contributor.author | Choi, Dong-Hoon | - |
| dc.contributor.author | Lee, Euibum | - |
| dc.contributor.author | Jo, Han-Shin | - |
| dc.contributor.author | Yook, Jong-Gwan | - |
| dc.date.accessioned | 2025-01-24T06:30:20Z | - |
| dc.date.available | 2025-01-24T06:30:20Z | - |
| dc.date.issued | 2024-04 | - |
| dc.identifier.issn | 1556-6013 | - |
| dc.identifier.issn | 1556-6021 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/206331 | - |
| dc.description.abstract | This study analyzes the phenomenon of electromagnetic (EM) leakage that occurs through cables and explores the potential for information forensics using deep learning-based image-processing algorithms. We focus on the transition-minimized differential signaling (TMDS) interface to analyze information leakage caused by the inherent differential signal synchronization errors in video graphics controllers (VGC). Our analysis includes detailed mathematical modeling of the EM leakage phenomena from the video display unit (VDU) interface that uses the TMDS protocol. Furthermore, this study presents mathematical models for distortions and alterations caused by the VDU characteristics and its associated RF front-end system. Utilizing mathematical models of EM phenomena, this paper presents a method for creating training datasets for deep learning-based signal processing algorithms by generating and augmenting pseudo leakage signals (PLS) that closely resemble actual leakage signals. This study confirms the practical utility of signal enhancement models trained with generated and augmented PLS in real-world scenarios. Validation involves applying the trained model to measured actual VDU leakage signals and evaluating the results using image quality metrics: peak signal-to-noise ratio (PSNR), signal-to-noise ratio (SNR), and the structural similarity index measure (SSIM). Ultimately, this study demonstrates the potential to develop deep learning models using theoretically generated PLS for VDU-targeted side-channel attacks, where collecting real training data poses a challenge. This suggests the potential for expanding into high-performance deep learning algorithms in future developments. | - |
| dc.format.extent | 15 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | Institute of Electrical and Electronics Engineers | - |
| dc.title | Data Generation and Augmentation Method for Deep Learning-Based VDU Leakage Signal Restoration Algorithm | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1109/TIFS.2024.3393748 | - |
| dc.identifier.scopusid | 2-s2.0-85191833457 | - |
| dc.identifier.wosid | 001218694900026 | - |
| dc.identifier.bibliographicCitation | IEEE Transactions on Information Forensics and Security, v.19, pp 5220 - 5234 | - |
| dc.citation.title | IEEE Transactions on Information Forensics and Security | - |
| dc.citation.volume | 19 | - |
| dc.citation.startPage | 5220 | - |
| dc.citation.endPage | 5234 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Computer Science | - |
| dc.relation.journalResearchArea | Engineering | - |
| dc.relation.journalWebOfScienceCategory | Computer Science, Theory & Methods | - |
| dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
| dc.subject.keywordPlus | ELECTROMAGNETIC EMANATIONS | - |
| dc.subject.keywordPlus | VIDEO INFORMATION | - |
| dc.subject.keywordAuthor | Codes | - |
| dc.subject.keywordAuthor | Compromising Emanations (CE) | - |
| dc.subject.keywordAuthor | Convolutional Neural Network (CNN) | - |
| dc.subject.keywordAuthor | data augmentation | - |
| dc.subject.keywordAuthor | Data models | - |
| dc.subject.keywordAuthor | deep learning | - |
| dc.subject.keywordAuthor | Electromagnetic Interference (EMI) | - |
| dc.subject.keywordAuthor | Image color analysis | - |
| dc.subject.keywordAuthor | information Leakage | - |
| dc.subject.keywordAuthor | LCD monitor | - |
| dc.subject.keywordAuthor | Monitoring | - |
| dc.subject.keywordAuthor | Protocols | - |
| dc.subject.keywordAuthor | Side-channel attacks | - |
| dc.subject.keywordAuthor | Standards | - |
| dc.subject.keywordAuthor | TEMPEST | - |
| dc.identifier.url | https://ieeexplore.ieee.org/document/10508597 | - |
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