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Deep-learning-driven end-to-end metalens imaging
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Seo, Joonhyuk | - |
| dc.contributor.author | Jo, Jaegang | - |
| dc.contributor.author | Kim, Joohoon | - |
| dc.contributor.author | Kang, Joonho | - |
| dc.contributor.author | Kang, Chanik | - |
| dc.contributor.author | Moon, Seong-Won | - |
| dc.contributor.author | Lee, Eunji | - |
| dc.contributor.author | Hong, Jehyeong | - |
| dc.contributor.author | Rho, Junsuk | - |
| dc.contributor.author | Chung, Haejun | - |
| dc.date.accessioned | 2025-02-12T06:00:56Z | - |
| dc.date.available | 2025-02-12T06:00:56Z | - |
| dc.date.issued | 2024-11 | - |
| dc.identifier.issn | 2577-5421 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/206401 | - |
| dc.description.abstract | Recent advances in metasurface lenses (metalenses) have shown great potential for opening a new era in compact imaging, photography, light detection, and ranging (LiDAR) and virtual reality/augmented reality applications. However, the fundamental trade-off between broadband focusing efficiency and operating bandwidth limits the performance of broadband metalenses, resulting in chromatic aberration, angular aberration, and a relatively low efficiency. A deep-learning-based image restoration framework is proposed to overcome these limitations and realize end-to-end metalens imaging, thereby achieving aberration-free full-color imaging for mass-produced metalenses with 10 mm diameter. Neural-network-assisted metalens imaging achieved a high resolution comparable to that of the ground truth image. | - |
| dc.format.extent | 13 | - |
| dc.language | 영어 | - |
| dc.language.iso | ENG | - |
| dc.publisher | SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | - |
| dc.title | Deep-learning-driven end-to-end metalens imaging | - |
| dc.type | Article | - |
| dc.publisher.location | 미국 | - |
| dc.identifier.doi | 10.1117/1.AP.6.6.066002 | - |
| dc.identifier.scopusid | 2-s2.0-85212931567 | - |
| dc.identifier.wosid | 001386075500004 | - |
| dc.identifier.bibliographicCitation | ADVANCED PHOTONICS, v.6, no.6, pp 1 - 13 | - |
| dc.citation.title | ADVANCED PHOTONICS | - |
| dc.citation.volume | 6 | - |
| dc.citation.number | 6 | - |
| dc.citation.startPage | 1 | - |
| dc.citation.endPage | 13 | - |
| dc.type.docType | Article | - |
| dc.description.isOpenAccess | Y | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.relation.journalResearchArea | Optics | - |
| dc.relation.journalWebOfScienceCategory | Optics | - |
| dc.subject.keywordPlus | BAND ACHROMATIC METALENS | - |
| dc.subject.keywordPlus | BANDWIDTH | - |
| dc.subject.keywordAuthor | visible metalens | - |
| dc.subject.keywordAuthor | deep learning | - |
| dc.subject.keywordAuthor | image restoration | - |
| dc.subject.keywordAuthor | full-color imaging | - |
| dc.identifier.url | https://www.spiedigitallibrary.org/journals/advanced-photonics/volume-6/issue-06/066002/Deep-learning-driven-end-to-end-metalens-imaging/10.1117/1.AP.6.6.066002.full | - |
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