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High performance of self-powered Ga2O3:Si/p-GaN heterojunction UV photodetectors

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dc.contributor.authorOanh Vu, Thi Kim-
dc.contributor.authorVan, Hai Bui-
dc.contributor.authorTu, Nguyen Xuan-
dc.contributor.authorVan Kha, Nguyen-
dc.contributor.authorThu Phuong, Bui Thi-
dc.contributor.authorMinh Hien, Nguyen Thi-
dc.contributor.authorKim, Eun Kyu-
dc.date.accessioned2025-04-10T08:30:19Z-
dc.date.available2025-04-10T08:30:19Z-
dc.date.issued2025-07-
dc.identifier.issn1369-8001-
dc.identifier.issn1873-4081-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/207033-
dc.description.abstractHigh performance ultraviolet (UV) photodetectors have garnered much interest for their wide range of potential in uses. On the basis of this, a self-powered UV photodetectors (PDs) based on β-Ga2O3:Si/p-GaN heterojunctions were fabricated by pulsed laser deposition (PLD) system equipped with a neodymium-doped yttrium aluminum garnet (Nd:YAG) laser at wavelength center of 266 nm. Then, the Ga2O3 (99.9 %) doped with 0.1 wt% Si was used as source to deposit Ga2O3:Si thin films on the p-GaN layer, which were deposited on c-sapphire substrates by sputtering technique. The high quality of β-Ga2O3:Si thin films are formed by well controlling the oxygen pressure during deposition, which significantly enhances the device performance. In the self-powered mode with the bias voltage of 0V, the photodetectors fabricated under oxygen pressure of 5 mTorr with low dark current of 0.6 nA, high photoresponsivity and detectivity of 2.44 × 10−2 A/W and 2.45x1011 cmHz1/2W, respectively. This study represents one of the initial self-powered UV photodetectors with unique properties, which greatly enhances the progress of multifunctional UV photodetectors.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherPergamon Press-
dc.titleHigh performance of self-powered Ga2O3:Si/p-GaN heterojunction UV photodetectors-
dc.typeArticle-
dc.publisher.location영국-
dc.identifier.doi10.1016/j.mssp.2025.109479-
dc.identifier.scopusid2-s2.0-105000237153-
dc.identifier.wosid001453301300001-
dc.identifier.bibliographicCitationMaterials Science in Semiconductor Processing, v.193, pp 1 - 8-
dc.citation.titleMaterials Science in Semiconductor Processing-
dc.citation.volume193-
dc.citation.startPage1-
dc.citation.endPage8-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.relation.journalWebOfScienceCategoryPhysics, Condensed Matter-
dc.subject.keywordPlusINTERFACE-
dc.subject.keywordPlusSTABILITY-
dc.subject.keywordAuthorSelf-powered-
dc.subject.keywordAuthorPhotodetectors-
dc.subject.keywordAuthorOxygen pressure-
dc.subject.keywordAuthorPulsed laser deposition-
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S1369800125002161?via%3Dihub-
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