A First-Order Noise-Shaping SAR ADC with PVT-Insensitive Closed-Loop Dynamic Amplifier and Two CDACs

Abstract

This paper presents a first-order noise-shaping (NS) successive approximation register (SAR) analog-to-digital converter (ADC) with a process, (supply) voltage, and temperature (PVT)-insensitive closed-loop integrator and data-weighted averaging (DWA). The use of a cascode floating inverter amplifier (FIA)-type dynamic amplifier with high gain enables an aggressive noise transfer function while minimizing the power consumption associated with the use of an active filter. In the proposed ADC, the residue is generated by a capacitive digital-to-analog converter (CDAC) employing DWA, which is made possible by employing a second CDAC, which operates after the SAR operation is completed. The proposed ADC is designed with a 28 nm CMOS process with 1 V power supply. The simulation results show that the ADC achieves the SNDR of 71.2 dB and power consumption of 228 μW when operated with a sampling rate of 80 MS/s and oversampling ratio (OSR) of 10. The Schreier figure-of-merit (FoM) is 173.6 dB, and Walden FoM is 9.6 fJ/conversion-step.