Advancing nano-optical investigations: Metallic and dielectric Mie particles in SPM techniques and their emerging applications

Abstract

Mie scattering between incident light and nanoparticles (NPs) plays a vital role in improving the performance of optical and photonic devices, such as sensors, light-emitting diodes, and solar cells. While traditional far-field spectroscopy and electromagnetic simulations have been used to study Mie scattering, these methods lack real-space imaging capabilities, limiting their ability to capture single-particle scattering phenomena. Scanning probe microscopy-based nanoscopy techniques have become essential for studying Mie scattering at the nanoscale to address this limitation. This review explores the theoretical foundations of Mie scattering and the role of near-field microscopy in bridging the gap between theory and experiment through high-resolution imaging. By focusing on real-space imaging, we highlight the practical aspects of Mie scattering and its applications in fields such as biosensing, photocatalysis, and materials science. Nanoscopy techniques allow for direct visualization of scattering processes in nanostructures, offering more profound insights into how NPs interact with light at the nanoscale. Additionally, we discuss the potential of artificial intelligence (AI) to enhance near-field analysis, providing more accurate interpretations of Mie scattering phenomena. In conclusion, combining advanced nanoscopy and AI-driven analysis will significantly advance our understanding of Mie scattering and its diverse applications in various scientific and technological fields. The synergy between cutting-edge imaging methods and computational simulation not only enriches our theoretical understanding of scattering phenomena but also accelerates the development of next-generation photonic devices, paving the way for a wide range of practical applications across scientific and technological domains.