Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Combining near-infrared spectroscopic signatures and physical traits based on machine vision to enhance accuracy in identification of the geographical origins of agricultural products

Authors
Jeong, SeongsooChoi, SeungheeOh, HyunwooKim, HaejinChang, Han-subSong, JisookKim, Ho JinKim, Dong-JinChung, Hoeil
Issue Date
Jan-2026
Publisher
ELSEVIER
Keywords
Agricultural products; Non-destructive authentication; NIR spectroscopy; Machine vision; Swin transformer; Multimodal classification
Citation
MICROCHEMICAL JOURNAL, v.220, pp 1 - 10
Pages
10
Indexed
SCIE
SCOPUS
Journal Title
MICROCHEMICAL JOURNAL
Volume
220
Start Page
1
End Page
10
URI
https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/210353
DOI
10.1016/j.microc.2025.116661
ISSN
0026-265X
1095-9149
Abstract
This study was the first to explore the combination of near-infrared (NIR) spectroscopy and machine vision to enhance accuracy in the identification of the geographical origins of agricultural products. To ensure accuracy, machine vision recognizing dissimilar physical traits of grains (appearance, shape, and texture) by their geographical origins was combined with NIR analysis. For this purpose, the NIR spectra and visual images of packed grains from six different agricultural products were analyzed. For the image analysis, the Segment Anything Model (SAM) was used to determine the proper cropping sizes for each product because the grain sizes differed by product. When the augmented images were input to Swin Transformer (ST), the average discrimination accuracy was 95.36 % and comparable to that using the NIR data (95.53 %). When multimodal approaches combining the NIR signatures and visual features of the samples were attempted, intermediate and late fusions enhanced the average accuracy to 98.2 %.
Files in This Item
Go to Link
Appears in
Collections
서울 자연과학대학 > 서울 화학과 > 1. Journal Articles
서울 공과대학 > ETC > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Dong Jin photo

Kim, Dong Jin
COLLEGE OF ENGINEERING (DEPARTMENT OF INTELLIGENCE COMPUTING)
Read more

Altmetrics

Total Views & Downloads

BROWSE