Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Nonlinear quantized conductance dynamics in vertical SiN RRAM for scalable memory-learning integration

Full metadata record
DC Field Value Language
dc.contributor.authorPark, Jihee-
dc.contributor.authorKim, Nawoon-
dc.contributor.authorNa, Hyesung-
dc.contributor.authorKim, Hyungjin-
dc.contributor.authorKim, Sungjun-
dc.date.accessioned2026-03-24T06:00:28Z-
dc.date.available2026-03-24T06:00:28Z-
dc.date.issued2026-09-
dc.identifier.issn1005-0302-
dc.identifier.issn1941-1162-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/211536-
dc.description.abstractWe report a vertical resistive random-access memory device based on a Pt/SiN/Ti stack, designed for multi-bit storage and neuromorphic computing. The device exhibits stable bipolar switching and achieves up to 7-bit (128-level) conductance states through precise control of compliance current and reset voltage. Quantized conductance plateaus, corresponding to integer and half-integer multiples of the quantum conductance G<inf>0</inf> = 2e2/h, reveal atomic-scale filament dynamics governed by nonlinear conduction processes. Diverse synaptic plasticity functions, including spike-number-, spike-rate-, spike-duration-, and spike-amplitude-dependent plasticity, were experimentally emulated. Neuromorphic simulations for the Modified National Institute of Standards and Technology dataset achieved classification accuracies exceeding 94 %, confirming the device's suitability for high-precision weight modulation. The vertical architecture ensures scalability toward three-dimensional integration, while robust retention and compatibility with current-based multi-bit modulation highlight its potential for complex-system-inspired edge AI and in-memory computing hardware.-
dc.format.extent16-
dc.language영어-
dc.language.isoENG-
dc.publisherELSEVIE-
dc.titleNonlinear quantized conductance dynamics in vertical SiN RRAM for scalable memory-learning integration-
dc.typeArticle-
dc.publisher.location네델란드-
dc.identifier.doi10.1016/j.jmst.2025.11.034-
dc.identifier.scopusid2-s2.0-105026656778-
dc.identifier.wosid001666594200001-
dc.identifier.bibliographicCitationJOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, v.266, pp 76 - 91-
dc.citation.titleJOURNAL OF MATERIALS SCIENCE & TECHNOLOGY-
dc.citation.volume266-
dc.citation.startPage76-
dc.citation.endPage91-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaMetallurgy & Metallurgical Engineering-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryMetallurgy & Metallurgical Engineering-
dc.subject.keywordPlusRANDOM-ACCESS MEMORY-
dc.subject.keywordPlusRESISTIVE SWITCHING CHARACTERISTICS-
dc.subject.keywordPlusLOW-POWER-
dc.subject.keywordPlusARCHITECTURE-
dc.subject.keywordPlusDEVICES-
dc.subject.keywordPlusEVOLUTION-
dc.subject.keywordPlusMECHANISMS-
dc.subject.keywordPlusTRAP-
dc.subject.keywordPlusHFOX-
dc.subject.keywordAuthorVertical rram-
dc.subject.keywordAuthorConductance quantization-
dc.subject.keywordAuthorMulti-bit memory-
dc.subject.keywordAuthorNeuromorphic computing-
dc.subject.keywordAuthorSynaptic plasticity-
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S100503022501182X?via%3Dihub-
Files in This Item
Go to Link
Appears in
Collections
서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Kim, Hyungjin photo

Kim, Hyungjin
COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE