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Low-Power, High-Performance, and Highly Reliable EM Gate Driver Circuit Using LTPO Technology for Mobile Displays

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dc.contributor.authorWee, Sung-Min-
dc.contributor.authorJang, Jun-Hyeok-
dc.contributor.authorKeum, Nack-Hyun-
dc.contributor.authorMoon, Hee-Ju-
dc.contributor.authorSong, Hee-Rim-
dc.contributor.authorKim, Sang-Hun-
dc.contributor.authorLim, Jaemyung-
dc.contributor.authorKwon, Oh-Kyong-
dc.date.accessioned2026-04-07T01:30:25Z-
dc.date.available2026-04-07T01:30:25Z-
dc.date.issued2026-01-
dc.identifier.issn0018-9383-
dc.identifier.issn1557-9646-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/212040-
dc.description.abstractThis article presents a compact, low-power, and high-performance pulsewidth-modulated (PWM) row driver circuit designed for high-resolution active-matrix organic light-emitting diode (AMOLED) displays, leveraging low-temperature polycrystalline silicon and oxide thin-film transistors (LTPO TFTs). The proposed 11T3C structure eliminates output intermediate voltage transitions and supports a wide range of variable refresh rates (VRRs) from 1 to 120 Hz, while minimizing both static and dynamic power consumption. A key innovation lies in the robust handling of oxide TFT threshold voltage variations using a bootstrapped control scheme that ensures stable turn-off behavior under stress-induced degradation. The proposed driver achieves fast transition times ( 1.01 mu s rising and 1.56 mu s falling) and maintains stable output across a 14 V swing, even under oxide V-TH shifts from -7 to + 7 V. Power consumption was measured to be 4.35 mW at 1 Hz and 8.98 mW at 120 Hz for 1600 driver stages (3200 channels), demonstrating significant power reductions compared to conventional circuits. Full-panel measurements on a 6.81-in QHD AMOLED display demonstrate superior performance in terms of power and reliability compared to prior art, and were validated through industry-level qualification testing, supporting its suitability for ultralow-power displaysystems.-
dc.format.extent8-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleLow-Power, High-Performance, and Highly Reliable EM Gate Driver Circuit Using LTPO Technology for Mobile Displays-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/TED.2025.3630615-
dc.identifier.scopusid2-s2.0-105022622571-
dc.identifier.wosid001620772500001-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.73, no.1, pp 352 - 359-
dc.citation.titleIEEE TRANSACTIONS ON ELECTRON DEVICES-
dc.citation.volume73-
dc.citation.number1-
dc.citation.startPage352-
dc.citation.endPage359-
dc.type.docTypeArticle; Early Access-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusA-SI-
dc.subject.keywordAuthorGate drivers-
dc.subject.keywordAuthorThreshold voltage-
dc.subject.keywordAuthorPower demand-
dc.subject.keywordAuthorThin film transistors-
dc.subject.keywordAuthorLogic gates-
dc.subject.keywordAuthorActive matrix organic light emitting diodes-
dc.subject.keywordAuthorTurning-
dc.subject.keywordAuthorSwitching circuits-
dc.subject.keywordAuthorLeakage currents-
dc.subject.keywordAuthorIntegrated circuit reliability-
dc.subject.keywordAuthorActive-matrix organic light-emitting diode (AMOLED)-
dc.subject.keywordAuthorbootstrapping technology-
dc.subject.keywordAuthorgate driver-
dc.subject.keywordAuthorhigh reliability-
dc.subject.keywordAuthorlow-power consumption-
dc.subject.keywordAuthorlow-temperature polycrystalline silicon oxide (LTPO)-
dc.subject.keywordAuthormobile display-
dc.subject.keywordAuthorvariable refresh rate (VRR) displays-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/11257854-
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