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CMS RPC link system tester and quality control

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dc.contributor.authorEsfandi, F.-
dc.contributor.authorEbrahimi, M.-
dc.contributor.authorZareian, E.-
dc.contributor.authorAmoozegar, V.-
dc.contributor.authorHosseini, Y.-
dc.contributor.authorBoghrati, B.-
dc.contributor.authorMohammadi Najafabadi, M.-
dc.contributor.authorKim, T.J.-
dc.contributor.authorAsilar, E.-
dc.contributor.authorRyou, Y.-
dc.contributor.authorTytgat, M.-
dc.contributor.authorMota Amarilo, K.-
dc.contributor.authorSamalan, A.-
dc.contributor.authorSkovpen, K.-
dc.contributor.authorAlves, G.-
dc.contributor.authorAlves Coelho, E.-
dc.contributor.authorMarujo da Silva, F.-
dc.contributor.authorBarroso Ferreira Filho, M.-
dc.contributor.authorDa Costa, E.-
dc.contributor.authorDe Jesus Damiao, D.-
dc.contributor.authorFerreira, B.-
dc.contributor.authorFonseca De Souza, S.-
dc.contributor.authorMundim, L.-
dc.contributor.authorNogima, H.-
dc.contributor.authorPinheiro, J.-
dc.contributor.authorSantoro, A.-
dc.contributor.authorThiel, M.-
dc.contributor.authorGomes De Souza, R.-
dc.contributor.authorAleksandrov, A.-
dc.contributor.authorHadjiiska, R.-
dc.contributor.authorIaydjiev, P.-
dc.contributor.authorShopova, M.-
dc.contributor.authorSultanov, G.-
dc.contributor.authorDimitrov, A.-
dc.contributor.authorLitov, L.-
dc.contributor.authorPavlov, B.-
dc.contributor.authorPetkov, P.-
dc.contributor.authorPetrov, A.-
dc.contributor.authorShumka, E.-
dc.contributor.authorCao, P.-
dc.contributor.authorDiao, W.-
dc.contributor.authorGong, W.-
dc.contributor.authorHou, Q.-
dc.contributor.authorKou, H.-
dc.contributor.authorLiu, Z.-A.-
dc.contributor.authorSong, J.-
dc.contributor.authorWang, N.-
dc.contributor.authorZhao, J.-
dc.contributor.authorQian, S.-
dc.contributor.authorAvila, C.-
dc.contributor.authorBarbosa Trujillo, D.-
dc.contributor.authorCabrera, A.-
dc.contributor.authorFlorez, C.-
dc.contributor.authorReyes Vega, J.-
dc.contributor.authorAly, R.-
dc.contributor.authorRadi, A.-
dc.contributor.authorAssran, Y.-
dc.contributor.authorCrotty, I.-
dc.contributor.authorMahmoud, M.-
dc.contributor.authorBalleyguier, L.-
dc.contributor.authorChen, X.-
dc.contributor.authorCombaret, C.-
dc.contributor.authorGalbit, G.-
dc.contributor.authorGouzevitch, M.-
dc.contributor.authorGrenier, G.-
dc.contributor.authorLaktineh, I.-
dc.contributor.authorLuciol, A.-
dc.contributor.authorMirabito, L.-
dc.contributor.authorTromeur, W.-
dc.contributor.authorBagaturia, I.-
dc.contributor.authorKemularia, O.-
dc.contributor.authorLomidze, I.-
dc.contributor.authorTsamalaidze, Z.-
dc.contributor.authorAbbrescia, M.-
dc.contributor.authorDe Filippis, N.-
dc.contributor.authorIaselli, G.-
dc.contributor.authorLoddo, F.-
dc.contributor.authorPugliese, G.-
dc.contributor.authorRamos, D.-
dc.contributor.authorBenussi, L.-
dc.contributor.authorBianco, S.-
dc.contributor.authorMeola, S.-
dc.contributor.authorPiccolo, D.-
dc.contributor.authorBuontempo, S.-
dc.contributor.authorCarnevali, F.-
dc.contributor.authorLista, L.-
dc.contributor.authorPaolucci, P.-
dc.contributor.authorFienga, F.-
dc.contributor.authorBraghieri, A.-
dc.contributor.authorMontagna, P.-
dc.contributor.authorRiccardi, C.-
dc.contributor.authorSalvini, P.-
dc.contributor.authorVitulo, P.-
dc.contributor.authorChoi, S.-
dc.contributor.authorHong, B.-
dc.contributor.authorLee, K.-
dc.contributor.authorGoh, J.-
dc.contributor.authorShin, J.-
dc.contributor.authorLee, Y.-
dc.contributor.authorPedraza, I.-
dc.contributor.authorUribe Estrada, C.-
dc.contributor.authorCastilla-Valdez, H.-
dc.contributor.authorLopez-Fernandez, R.-
dc.contributor.authorSánchez Hernández, A.-
dc.contributor.authorRamírez García, M.-
dc.contributor.authorRamirez Guadarrama, D.-
dc.contributor.authorShah, M.-
dc.contributor.authorVazquez, E.-
dc.contributor.authorZaganidis, N.-
dc.contributor.authorAhmad, A.-
dc.contributor.authorAsghar, M.-
dc.contributor.authorHoorani, H.-
dc.contributor.authorMuhammad, S.-
dc.contributor.authorEysermans, J.-
dc.date.accessioned2026-06-04T07:30:28Z-
dc.date.available2026-06-04T07:30:28Z-
dc.date.issued2025-06-
dc.identifier.issn1748-0221-
dc.identifier.issn1748-0221-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/213005-
dc.description.abstractThe Link System of resistive plate chambers (RPC) within the CMS Muon detector is being upgraded as part of CMS upgrade phase-2, aimed at optimising performance for the high luminosity LHC (HL-LHC) environment. This upgrade employs new electronics to improve Muon hit timing resolution and handle higher data rates. Key components of the upgraded system are the link boards and control boards. For the phase-2 upgrade, 1,592 boards need to be produced. The production is divided into two phases, pilot production and full production, to secure the quality of the entire production. This paper outlines a three-step production test plan for the pilot production of the Link System. This test plan ensures quality and functionality by performing primary quality control, basic electronics tests, and advanced system performance testing sequentially. Each step is subject to strict quality control and requires approval before proceeding. This structured approach optimizes error detection and resolution, leading to accurate and reliable results and ensuring that the upgraded system meets the operational requirements of the HL-LHC.-
dc.format.extent13-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Physics-
dc.titleCMS RPC link system tester and quality control-
dc.typeArticle-
dc.publisher.location영국-
dc.identifier.doi10.1088/1748-0221/20/06/P06023-
dc.identifier.scopusid2-s2.0-105008924431-
dc.identifier.wosid001519060800001-
dc.identifier.bibliographicCitationJournal of Instrumentation, v.20, no.6, pp 1 - 13-
dc.citation.titleJournal of Instrumentation-
dc.citation.volume20-
dc.citation.number6-
dc.citation.startPage1-
dc.citation.endPage13-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaInstruments & Instrumentation-
dc.relation.journalWebOfScienceCategoryInstruments & Instrumentation-
dc.subject.keywordPlusData quality-
dc.subject.keywordPlusDigital circuits-
dc.subject.keywordPlusMicrostrip devices-
dc.subject.keywordPlusPhase comparators-
dc.subject.keywordPlusQuality control-
dc.subject.keywordAuthorData acquisition circuits-
dc.subject.keywordAuthorData acquisition concepts-
dc.subject.keywordAuthorDigital electronic circuits-
dc.subject.keywordAuthorTrigger concepts and systems (hardware and software)-
dc.identifier.urlhttps://iopscience.iop.org/article/10.1088/1748-0221/20/06/P06023-
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