Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Comprehensive PDN Methodology for DRAM: Early PDN and Iterative PDN

Full metadata record
DC Field Value Language
dc.contributor.authorHyun, Jinhoon-
dc.contributor.authorJeong, Inchul-
dc.contributor.authorChu, Shinho-
dc.contributor.authorLim, Jaemyung-
dc.date.accessioned2026-06-22T05:00:25Z-
dc.date.available2026-06-22T05:00:25Z-
dc.date.issued2026-04-
dc.identifier.issn0278-0070-
dc.identifier.issn1937-4151-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/213963-
dc.description.abstractIn modern DRAM design, IR-drop has emerged as a critical factor leading to operation failures, primarily due to reduced metal resources and increased supply current demands. Consequently, estimating and addressing IR-drop throughout the DRAM design process has become a crucial sign-off consideration. The proposed comprehensive methodology for the power delivery network (PDN) includes accurate and efficient estimation at two key stages: early in the design process (Early PDN) and during post-physical design sign-off validation (Iterative PDN). The Early PDN approach employs simplified modeling to achieve reasonable accuracy, serving as a guideline for the initial PDN design. Subsequently, the Iterative PDN method provides a fast yet detailed analysis of the entire DRAM, including the PDN, ensuring it is suitable for final sign-off. By applying this methodology, PDN behavior can be effectively predicted and optimized, ensuring robustness. This enhances the reliability and performance of DRAM designs.-
dc.format.extent5-
dc.language영어-
dc.language.isoENG-
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC-
dc.titleComprehensive PDN Methodology for DRAM: Early PDN and Iterative PDN-
dc.typeArticle-
dc.publisher.location미국-
dc.identifier.doi10.1109/TCAD.2025.3607129-
dc.identifier.scopusid2-s2.0-105015415959-
dc.identifier.wosid001723877500005-
dc.identifier.bibliographicCitationIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, v.45, no.4, pp 1782 - 1786-
dc.citation.titleIEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS-
dc.citation.volume45-
dc.citation.number4-
dc.citation.startPage1782-
dc.citation.endPage1786-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaComputer Science-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryComputer Science, Hardware & Architecture-
dc.relation.journalWebOfScienceCategoryComputer Science, Interdisciplinary Applications-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusComputer aided design-
dc.subject.keywordPlusDynamic random access storage-
dc.subject.keywordPlusElectric power transmission-
dc.subject.keywordPlusIntegrated circuit design-
dc.subject.keywordPlusLogic design-
dc.subject.keywordPlusReliability-
dc.subject.keywordAuthorRandom access memory-
dc.subject.keywordAuthorMetals-
dc.subject.keywordAuthorIterative methods-
dc.subject.keywordAuthorCircuits-
dc.subject.keywordAuthorVoltage measurement-
dc.subject.keywordAuthorIntegrated circuit modeling-
dc.subject.keywordAuthorComputer architecture-
dc.subject.keywordAuthorEstimation-
dc.subject.keywordAuthorMicroprocessors-
dc.subject.keywordAuthorComputational modeling-
dc.subject.keywordAuthorDRAM power integrity-
dc.subject.keywordAuthorhigh-bandwidth memory (HBM)-
dc.subject.keywordAuthorIR-drop-
dc.subject.keywordAuthoron-chip power delivery network (PDN)-
dc.identifier.urlhttps://ieeexplore.ieee.org/document/11153455-
Files in This Item
Go to Link
Appears in
Collections
서울 공과대학 > 서울 융합전자공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Lim, Jaemyung photo

Lim, Jaemyung
COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE