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2차원 나노물질의 표준 측정 분석법 개발
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 정문석 | - |
| dc.date.accessioned | 2026-06-25T12:03:53Z | - |
| dc.date.available | 2026-06-25T12:03:53Z | - |
| dc.date.issued | 2025-11-07 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/216631 | - |
| dc.title | 2차원 나노물질의 표준 측정 분석법 개발 | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 제 4회 한국표면분석학회 종합학술대회 | - |
| dc.citation.conferencePlace | 대전 KW 컨벤션센터 | - |
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Collections - 서울 자연과학대학 > 서울 물리학과 > 2. Conference Papers
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Related Researcher
- Jeong, Mun Seok
- COLLEGE OF NATURAL SCIENCES (DEPARTMENT OF PHYSICS)