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In-situ TEM Investigation of Electric-Field-Induced Phase Evolution Mechanism in HfO2-based Thin Films
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이승용 | - |
| dc.date.accessioned | 2026-06-25T12:32:36Z | - |
| dc.date.available | 2026-06-25T12:32:36Z | - |
| dc.date.issued | 2025-11-07 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/216685 | - |
| dc.title | In-situ TEM Investigation of Electric-Field-Induced Phase Evolution Mechanism in HfO2-based Thin Films | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 제4회 2025 한국표면분석학회 종합학술대회 | - |
| dc.citation.conferencePlace | 대전 KW컨벤션 센터 | - |
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Related Researcher
- Lee, Seung Yong
- COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)