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Application of Device-Degradation Modeling to SiGe-LNA Analysis
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 송익현 | - |
| dc.date.accessioned | 2026-06-25T13:38:42Z | - |
| dc.date.available | 2026-06-25T13:38:42Z | - |
| dc.date.issued | 2025-01-21 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/216793 | - |
| dc.title | Application of Device-Degradation Modeling to SiGe-LNA Analysis | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | 2025 IEEE Radio and Wireless Week | - |
| dc.citation.conferencePlace | San Juan, Puerto Rico, 미국 | - |
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Song, Ickhyun
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)