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Toward Understanding Temperature and Bias Instabilities of Anti-ambipolar Transistors via Low-Frequency Noise Spectroscopy
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 유호천 | - |
| dc.date.accessioned | 2026-06-25T17:33:47Z | - |
| dc.date.available | 2026-06-25T17:33:47Z | - |
| dc.date.issued | 2025-07-09 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/217479 | - |
| dc.title | Toward Understanding Temperature and Bias Instabilities of Anti-ambipolar Transistors via Low-Frequency Noise Spectroscopy | - |
| dc.type | Conference | - |
| dc.citation.conferenceName | International Symposium on Flexible Organic Electronics (ISOFOE) 2025 | - |
| dc.citation.conferencePlace | Thessaloniki | - |
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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- Yoo, Hocheon
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)