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Cited 3 time in webofscience Cited 3 time in scopus
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Skew cancellation technique for > 256-Gbyte/s high-bandwidth memory (HBM)

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dc.contributor.authorAhn, Key-One-
dc.contributor.authorYoon, Chong Seung-
dc.date.accessioned2021-08-02T16:52:27Z-
dc.date.available2021-08-02T16:52:27Z-
dc.date.issued2016-06-
dc.identifier.issn0013-5194-
dc.identifier.issn1350-911X-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/23030-
dc.description.abstractThe skews among multi-Gbit/s data signals of through-silicon-via-based parallel DRAM interface are cancelled without any overhead on DRAM dies. All the skew cancelling circuits are realised on a logic die which cancels the write and read path skews separately. A prototype chip with the proposed skew cancellation has been implemented in a 65 nm standard CMOS technology. After the skew cancellation, the residual skew of read and write paths are 12 and 18 ps, respectively.-
dc.format.extent2-
dc.language영어-
dc.language.isoENG-
dc.publisherInstitute of Electrical Engineers-
dc.titleSkew cancellation technique for > 256-Gbyte/s high-bandwidth memory (HBM)-
dc.typeArticle-
dc.publisher.location영국-
dc.identifier.doi10.1049/el.2015.4001-
dc.identifier.scopusid2-s2.0-84975063370-
dc.identifier.wosid000378886300036-
dc.identifier.bibliographicCitationElectronics Letters, v.52, no.13, pp 1155 - 1156-
dc.citation.titleElectronics Letters-
dc.citation.volume52-
dc.citation.number13-
dc.citation.startPage1155-
dc.citation.endPage1156-
dc.type.docTypeArticle-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClasssci-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusCancellation techniques-
dc.subject.keywordPlusData signals-
dc.subject.keywordPlusHigh bandwidth-
dc.subject.keywordPlusPrototype chip-
dc.subject.keywordPlusStandard CMOS technology-
dc.identifier.urlhttps://ietresearch.onlinelibrary.wiley.com/doi/10.1049/el.2015.4001-
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