High-Accuracy, Compact Scanning Method and Circuit for Resistive Sensor Arrays
DC Field | Value | Language |
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dc.contributor.author | Kim, Jong Seok | - |
dc.contributor.author | Kwon, Dae-Yong | - |
dc.contributor.author | Choi, Byong-Deok | - |
dc.date.accessioned | 2021-08-02T17:31:19Z | - |
dc.date.available | 2021-08-02T17:31:19Z | - |
dc.date.created | 2021-05-12 | - |
dc.date.issued | 2016-02 | - |
dc.identifier.issn | 1424-8220 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/24009 | - |
dc.description.abstract | The zero-potential scanning circuit is widely used as read-out circuit for resistive sensor arrays because it removes a well known problem: crosstalk current. The zero-potential scanning circuit can be divided into two groups based on type of row drivers. One type is a row driver using digital buffers. It can be easily implemented because of its simple structure, but we found that it can cause a large read-out error which originates from on-resistance of the digital buffers used in the row driver. The other type is a row driver composed of operational amplifiers. It, very accurately, reads the sensor resistance, but it uses a large number of operational amplifiers to drive rows of the sensor array; therefore, it severely increases the power consumption, cost, and system complexity. To resolve the inaccuracy or high complexity problems founded in those previous circuits, we propose a new row driver which uses only one operational amplifier to drive all rows of a sensor array with high accuracy. The measurement results with the proposed circuit to drive a 4 x 4 resistor array show that the maximum error is only 0.1% which is remarkably reduced from 30.7% of the previous counterpart. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | Multidisciplinary Digital Publishing Institute (MDPI) | - |
dc.title | High-Accuracy, Compact Scanning Method and Circuit for Resistive Sensor Arrays | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Kim, Jong Seok | - |
dc.contributor.affiliatedAuthor | Choi, Byong-Deok | - |
dc.identifier.doi | 10.3390/s16020155 | - |
dc.identifier.scopusid | 2-s2.0-84955319981 | - |
dc.identifier.wosid | 000371787800057 | - |
dc.identifier.bibliographicCitation | Sensors, v.16, no.2, pp.1 - 16 | - |
dc.relation.isPartOf | Sensors | - |
dc.citation.title | Sensors | - |
dc.citation.volume | 16 | - |
dc.citation.number | 2 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 16 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Analytical | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.subject.keywordPlus | TACTILE SENSING ARRAY | - |
dc.subject.keywordPlus | INFRARED DETECTORS | - |
dc.subject.keywordPlus | ERROR ANALYSIS | - |
dc.subject.keywordPlus | TEMPERATURE | - |
dc.subject.keywordPlus | FABRICATION | - |
dc.subject.keywordPlus | HARDWARE | - |
dc.subject.keywordPlus | DESIGN | - |
dc.subject.keywordAuthor | sensor array | - |
dc.subject.keywordAuthor | resistive sensor | - |
dc.subject.keywordAuthor | crosstalk | - |
dc.subject.keywordAuthor | read-out circuit | - |
dc.subject.keywordAuthor | row driver | - |
dc.identifier.url | https://www.mdpi.com/1424-8220/16/2/155 | - |
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