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Cited 13 time in webofscience Cited 14 time in scopus
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Shrinkage estimation-based source localization with minimum mean squared error criterion and minimum bias criterion

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dc.contributor.authorPark, Chee-Hyun-
dc.contributor.authorChang, Joon-Hyuk-
dc.date.accessioned2021-08-02T18:30:51Z-
dc.date.available2021-08-02T18:30:51Z-
dc.date.created2021-05-12-
dc.date.issued2014-06-
dc.identifier.issn1051-2004-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/25861-
dc.description.abstractIn this paper, we propose two novel source localization methods; one is the shrinkage estimator with the minimum mean squared error criterion, and the other is the shrinkage estimator with the minimum bias criterion. The mean squared error performance of the two-step weighted least squares deteriorates in the large noise variance regimes. In order to improve the two-step weighted least squares in the large noise variance regimes, the shrinkage factor is multiplied by the two-step weighted least squares estimator, and then the novel estimator is determined such that the mean squared error and squared bias are minimized. Simulation results show that the mean squared error performances of the proposed methods are better than those of the two-step weighted least squares method as well as the minimax estimator in a regime with large measurement noise variances-
dc.language영어-
dc.language.isoen-
dc.publisherACADEMIC PRESS INC ELSEVIER SCIENCE-
dc.titleShrinkage estimation-based source localization with minimum mean squared error criterion and minimum bias criterion-
dc.typeArticle-
dc.contributor.affiliatedAuthorChang, Joon-Hyuk-
dc.identifier.doi10.1016/j.dsp.2014.02.009-
dc.identifier.scopusid2-s2.0-84899442476-
dc.identifier.wosid000335367800008-
dc.identifier.bibliographicCitationDIGITAL SIGNAL PROCESSING, v.29, pp.100 - 106-
dc.relation.isPartOfDIGITAL SIGNAL PROCESSING-
dc.citation.titleDIGITAL SIGNAL PROCESSING-
dc.citation.volume29-
dc.citation.startPage100-
dc.citation.endPage106-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordPlusLEAST-SQUARES-
dc.subject.keywordPlusLOCATION-
dc.subject.keywordPlusREGRESSION-
dc.subject.keywordPlusSYSTEMS-
dc.subject.keywordPlusMODEL-
dc.subject.keywordAuthorSource localization-
dc.subject.keywordAuthorShrinkage factor-
dc.subject.keywordAuthorMinimum mean squared error-
dc.subject.keywordAuthorMinimum bias-
dc.subject.keywordAuthorWeighted least squares-
dc.subject.keywordAuthorTime-of-arrival-
dc.identifier.urlhttps://www.sciencedirect.com/science/article/pii/S1051200414000463?via%3Dihub-
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