Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

Enhanced ferromagnetism by preventing antiferromagnetic MnO2 in InP:Be/Mn/InP:Be triple layers fabricated using molecular beam epitaxy

Full metadata record
DC Field Value Language
dc.contributor.authorLee, D. J.-
dc.contributor.authorPark, C. S.-
dc.contributor.authorLee, Cheol Jin-
dc.contributor.authorSong, J. D.-
dc.contributor.authorKoo, H. C.-
dc.contributor.authorYoon, Chong S.-
dc.contributor.authorYoon, Im Taek-
dc.contributor.authorKim, H. S.-
dc.contributor.authorKang, T. W.-
dc.contributor.authorShon, Yoon-
dc.date.accessioned2021-08-02T18:51:25Z-
dc.date.available2021-08-02T18:51:25Z-
dc.date.created2021-05-12-
dc.date.issued2014-04-
dc.identifier.issn1567-1739-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/26513-
dc.description.abstractThe p-type InP:Be/Mn/InMnP:Be triple epilayers were prepared using MBE to increase Tc (>300 K) by preventing MnO2. After milling 1-3 nm of epilayers thickness from the top surface, the transmission electron microscopy (TEM) and X-ray diffraction (XRD) revealed no MnO2 and precipitates, and TEM and XRD results coincide with results of ferromagnetism. The enhanced ferromagnetic transition at >300 K corresponds to InMnP:Be. The increased ferromagnetic coupling without MnO2 is considered to originate from the increased p-d hybridation. These results demonstrate that InP-based ferromagnetic semiconductor layers having enhanced ferromagnetism can be formed by above process. (C) 2014 Elsevier B.V. All rights-
dc.language영어-
dc.language.isoen-
dc.publisherELSEVIER SCIENCE BV-
dc.titleEnhanced ferromagnetism by preventing antiferromagnetic MnO2 in InP:Be/Mn/InP:Be triple layers fabricated using molecular beam epitaxy-
dc.typeArticle-
dc.contributor.affiliatedAuthorYoon, Chong S.-
dc.identifier.doi10.1016/j.cap.2014.01.017-
dc.identifier.scopusid2-s2.0-84894263046-
dc.identifier.wosid000333977100007-
dc.identifier.bibliographicCitationCURRENT APPLIED PHYSICS, v.14, no.4, pp.558 - 562-
dc.relation.isPartOfCURRENT APPLIED PHYSICS-
dc.citation.titleCURRENT APPLIED PHYSICS-
dc.citation.volume14-
dc.citation.number4-
dc.citation.startPage558-
dc.citation.endPage562-
dc.type.rimsART-
dc.type.docTypeArticle-
dc.identifier.kciidART001875182-
dc.description.journalClass1-
dc.description.isOpenAccessN-
dc.description.journalRegisteredClassscie-
dc.description.journalRegisteredClassscopus-
dc.description.journalRegisteredClasskci-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalResearchAreaPhysics-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryPhysics, Applied-
dc.subject.keywordPlusNEUTRAL MANGANESE ACCEPTOR-
dc.subject.keywordPlusINP-
dc.subject.keywordPlusSEMICONDUCTORS-
dc.subject.keywordAuthorp-type InP:Be/Mn/InP:Be triple layers-
dc.subject.keywordAuthorIncreased T-c-
dc.subject.keywordAuthorMBE-
Files in This Item
There are no files associated with this item.
Appears in
Collections
서울 공과대학 > 서울 신소재공학부 > 1. Journal Articles

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Related Researcher

Researcher Yoon, Chong Seung photo

Yoon, Chong Seung
COLLEGE OF ENGINEERING (SCHOOL OF MATERIALS SCIENCE AND ENGINEERING)
Read more

Altmetrics

Total Views & Downloads

BROWSE