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Data Mining Approach to Selection of Critical Steps for Semiconductor Wafer Fabrication
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 이동희 | - |
| dc.date.accessioned | 2021-08-02T22:27:00Z | - |
| dc.date.available | 2021-08-02T22:27:00Z | - |
| dc.date.created | 2021-07-01 | - |
| dc.date.issued | 2017-12-04 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/29853 | - |
| dc.publisher | 대한산업공학회 | - |
| dc.title | Data Mining Approach to Selection of Critical Steps for Semiconductor Wafer Fabrication | - |
| dc.type | Conference | - |
| dc.contributor.affiliatedAuthor | 이동희 | - |
| dc.identifier.bibliographicCitation | Asia-Pacific Industrial Engineering and Management Systems | - |
| dc.relation.isPartOf | Asia-Pacific Industrial Engineering and Management Systems | - |
| dc.citation.title | Asia-Pacific Industrial Engineering and Management Systems | - |
| dc.citation.conferencePlace | 인도네시아 족자카르타 | - |
| dc.type.rims | CONF | - |
| dc.description.journalClass | 1 | - |
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