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Electrical Features and Reliability of Ta2O5-based Conductive Bridge Random Access Memory
- Authors
- 박재근
- Issue Date
- 16-Nov-2017
- Place
- 현대호텔, 경주
- Conference Name
- 2017 한국재료학회 추계학술대회
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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