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Microvoid Growth in the Interfaces during Aging

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dc.contributor.author김영호-
dc.date.accessioned2021-08-03T04:51:19Z-
dc.date.available2021-08-03T04:51:19Z-
dc.date.created2021-06-30-
dc.date.issued2016-12-05-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/33975-
dc.publisherWorld Academy of Science, Engineering and Technology-
dc.titleMicrovoid Growth in the Interfaces during Aging-
dc.typeConference-
dc.contributor.affiliatedAuthor김영호-
dc.identifier.bibliographicCitation18th International Conference on Electronic Packaging and Systems-
dc.relation.isPartOf18th International Conference on Electronic Packaging and Systems-
dc.citation.title18th International Conference on Electronic Packaging and Systems-
dc.citation.conferencePlaceHong Kong, China-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 공과대학 > 서울 신소재공학부 > 2. Conference Papers

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