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Temperature Dependence of Reliability for Magnetic Tunnel Junctions with a Thin MgO Dielectric Film and TCAD modeling
- Authors
- 송윤흡
- Issue Date
- 20-Feb-2016
- Place
- Singapore
- Conference Name
- The International Conference on Engineering and Applied Sciences 2016
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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Related Researcher
- Song, Yun Heub
- COLLEGE OF ENGINEERING (SCHOOL OF ELECTRONIC ENGINEERING)