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Enhancement of electrical characteristics for FinFETs due to an embedded oxide layer
- Authors
- 김태환
- Issue Date
- 8-Dec-2015
- Publisher
- Applied Physics Division, The Korean Physical Siciety
- Citation
- The 9th International Conference on Advanced Materials and Devices
- Conference Name
- The 9th International Conference on Advanced Materials and Devices
- Place
- Jeju, Korea
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Collections - 서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers
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