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The enhancement of electrical characteristics of silicon based tunneling field-effect transistors with a buried cylindrical gate

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dc.contributor.author김태환-
dc.date.accessioned2021-08-03T06:46:54Z-
dc.date.available2021-08-03T06:46:54Z-
dc.date.created2021-06-30-
dc.date.issued2015-12-08-
dc.identifier.urihttps://scholarworks.bwise.kr/hanyang/handle/2021.sw.hanyang/37742-
dc.publisherApplied Physics Division, Korean Physical Society-
dc.titleThe enhancement of electrical characteristics of silicon based tunneling field-effect transistors with a buried cylindrical gate-
dc.typeConference-
dc.contributor.affiliatedAuthor김태환-
dc.identifier.bibliographicCitationThe 9th International Conference on Advanced Materials and Devices-
dc.relation.isPartOfThe 9th International Conference on Advanced Materials and Devices-
dc.citation.titleThe 9th International Conference on Advanced Materials and Devices-
dc.citation.conferencePlaceJeju, Korea-
dc.type.rimsCONF-
dc.description.journalClass1-
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서울 공과대학 > 서울 융합전자공학부 > 2. Conference Papers

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